Early stages of growth and nanostructure of Pb(Zr,Ti)O-3 thin films observed by atomic force microscopy

Physics

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

Published

Standard

Early stages of growth and nanostructure of Pb(Zr,Ti)O-3 thin films observed by atomic force microscopy. / Craciun, F. ; Verardi, P.; Dinescu, M. et al.
Thin films epitaxial growth and nanostructures : proceedings of the EMRS Spring Conference, Strasbourg, France, June 16-19, 1998 / . ed. / Erich Kasper; Kang L. Wang; H. Hasegawa. Amsterdam: Elsevier, 1999. p. 281-285.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

Harvard

Craciun, F, Verardi, P, Dinescu, M, Dinelli, F & Kolosov, O 1999, Early stages of growth and nanostructure of Pb(Zr,Ti)O-3 thin films observed by atomic force microscopy. in E Kasper, KL Wang & H Hasegawa (eds), Thin films epitaxial growth and nanostructures : proceedings of the EMRS Spring Conference, Strasbourg, France, June 16-19, 1998 / . Elsevier, Amsterdam, pp. 281-285, Symposium on Thin Films Epitaxial Growth and Nanostructures, at the E-MRS Spring Meeting 1998, STRASBOURG, 16/06/98.

APA

Craciun, F., Verardi, P., Dinescu, M., Dinelli, F., & Kolosov, O. (1999). Early stages of growth and nanostructure of Pb(Zr,Ti)O-3 thin films observed by atomic force microscopy. In E. Kasper, K. L. Wang, & H. Hasegawa (Eds.), Thin films epitaxial growth and nanostructures : proceedings of the EMRS Spring Conference, Strasbourg, France, June 16-19, 1998 / (pp. 281-285). Elsevier.

Vancouver

Craciun F, Verardi P, Dinescu M, Dinelli F, Kolosov O. Early stages of growth and nanostructure of Pb(Zr,Ti)O-3 thin films observed by atomic force microscopy. In Kasper E, Wang KL, Hasegawa H, editors, Thin films epitaxial growth and nanostructures : proceedings of the EMRS Spring Conference, Strasbourg, France, June 16-19, 1998 / . Amsterdam: Elsevier. 1999. p. 281-285

Author

Craciun, F. ; Verardi, P. ; Dinescu, M. et al. / Early stages of growth and nanostructure of Pb(Zr,Ti)O-3 thin films observed by atomic force microscopy. Thin films epitaxial growth and nanostructures : proceedings of the EMRS Spring Conference, Strasbourg, France, June 16-19, 1998 / . editor / Erich Kasper ; Kang L. Wang ; H. Hasegawa. Amsterdam : Elsevier, 1999. pp. 281-285

Bibtex

@inproceedings{0fe4bcaccbd64dc1b18e6751fa5671d5,

title = "Early stages of growth and nanostructure of Pb(Zr,Ti)O-3 thin films observed by atomic force microscopy",

abstract = "We prepared lead zirconate-titanate (PZT) layers with different thicknesses on Au coated Si(100) and Si(lll) wafers by pulsed laser deposition, using the same set of experimental conditions: a Nd-YAG laser, 1064 nm, 10 ns, 10 Hz, substrate temperature 370 degrees C, oxygen pressure 150 mTorr, laser fluence 25 J/cm(2), by varying the number of laser pulses. Different analysis put in evidence the crystallographic structure and chemical composition of films. Surface morphology was examined by atomic force microscopy (AFM). Analysis of films with very few atomic layers suggests that the growth proceeds by Volmer-Weber island-growth mechanism. Different geometrical, chemical and kinetic factors responsible for this type of growth are discussed. Comparative AFM analyses of surface roughness performed on films with different thickness allow for the study of the interface width evolution during the growth and to predict the conditions for obtaining films with a smooth surface. (C) 1998 Elsevier Science S.A. All rights reserved.",

author = "F. Craciun and P. Verardi and M. Dinescu and F. Dinelli and Oleg Kolosov",

year = "1999",

language = "English",

isbn = "0-08-043606-4",

pages = "281--285",

editor = "Erich Kasper and Wang, {Kang L.} and H. Hasegawa",

booktitle = "Thin films epitaxial growth and nanostructures : proceedings of the EMRS Spring Conference, Strasbourg, France, June 16-19, 1998 /",

publisher = "Elsevier",

note = "Symposium on Thin Films Epitaxial Growth and Nanostructures, at the E-MRS Spring Meeting 1998 ; Conference date: 16-06-1998 Through 19-06-1998",

}

RIS

TY - GEN

T1 - Early stages of growth and nanostructure of Pb(Zr,Ti)O-3 thin films observed by atomic force microscopy

AU - Craciun, F.

AU - Verardi, P.

AU - Dinescu, M.

AU - Dinelli, F.

AU - Kolosov, Oleg

PY - 1999

Y1 - 1999

N2 - We prepared lead zirconate-titanate (PZT) layers with different thicknesses on Au coated Si(100) and Si(lll) wafers by pulsed laser deposition, using the same set of experimental conditions: a Nd-YAG laser, 1064 nm, 10 ns, 10 Hz, substrate temperature 370 degrees C, oxygen pressure 150 mTorr, laser fluence 25 J/cm(2), by varying the number of laser pulses. Different analysis put in evidence the crystallographic structure and chemical composition of films. Surface morphology was examined by atomic force microscopy (AFM). Analysis of films with very few atomic layers suggests that the growth proceeds by Volmer-Weber island-growth mechanism. Different geometrical, chemical and kinetic factors responsible for this type of growth are discussed. Comparative AFM analyses of surface roughness performed on films with different thickness allow for the study of the interface width evolution during the growth and to predict the conditions for obtaining films with a smooth surface. (C) 1998 Elsevier Science S.A. All rights reserved.

AB - We prepared lead zirconate-titanate (PZT) layers with different thicknesses on Au coated Si(100) and Si(lll) wafers by pulsed laser deposition, using the same set of experimental conditions: a Nd-YAG laser, 1064 nm, 10 ns, 10 Hz, substrate temperature 370 degrees C, oxygen pressure 150 mTorr, laser fluence 25 J/cm(2), by varying the number of laser pulses. Different analysis put in evidence the crystallographic structure and chemical composition of films. Surface morphology was examined by atomic force microscopy (AFM). Analysis of films with very few atomic layers suggests that the growth proceeds by Volmer-Weber island-growth mechanism. Different geometrical, chemical and kinetic factors responsible for this type of growth are discussed. Comparative AFM analyses of surface roughness performed on films with different thickness allow for the study of the interface width evolution during the growth and to predict the conditions for obtaining films with a smooth surface. (C) 1998 Elsevier Science S.A. All rights reserved.

M3 - Conference contribution/Paper

SN - 0-08-043606-4

SP - 281

EP - 285

BT - Thin films epitaxial growth and nanostructures : proceedings of the EMRS Spring Conference, Strasbourg, France, June 16-19, 1998 /

A2 - Kasper, Erich

A2 - Wang, Kang L.

A2 - Hasegawa, H.

PB - Elsevier

CY - Amsterdam

T2 - Symposium on Thin Films Epitaxial Growth and Nanostructures, at the E-MRS Spring Meeting 1998

Y2 - 16 June 1998 through 19 June 1998

ER -

Research