Submitted manuscript, 40.5 KB, PDF document
Research output: Patent
Research output: Patent
}
TY - PAT
T1 - Instrument for high throughput measurement of material physical properties
AU - Hajduk, Damian
AU - Carlson, Eric
AU - Freitag, Christopher
AU - Kolosov, Oleg
PY - 2002/1/23
Y1 - 2002/1/23
N2 - A method for high throughput mechanical property and bulge testing of materials libraries. A plurality of samples on a substrate are monitored for their response to a force from a fluid.
AB - A method for high throughput mechanical property and bulge testing of materials libraries. A plurality of samples on a substrate are monitored for their response to a force from a fluid.
KW - high throughput screening
KW - combinatorial materials discovery
KW - polymers
KW - films
KW - mechanical property
KW - parallel measurements
M3 - Patent
M1 - JP2002-22630A
ER -