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Instrument for high throughput measurement of material physical properties

Research output: Patent

Published

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Instrument for high throughput measurement of material physical properties. / Hajduk, Damian (Inventor); Carlson, Eric (Inventor); Freitag, Christopher (Inventor); Kolosov, Oleg (Inventor).

Patent No.: JP2002-22630A. Jan 23, 2002.

Research output: Patent

Harvard

Hajduk, D, Carlson, E, Freitag, C & Kolosov, O Jan. 23 2002, Instrument for high throughput measurement of material physical properties, Patent No. JP2002-22630A.

APA

Hajduk, D., Carlson, E., Freitag, C., & Kolosov, O. (2002). Instrument for high throughput measurement of material physical properties. (Patent No. JP2002-22630A).

Vancouver

Hajduk D, Carlson E, Freitag C, Kolosov O, inventors. Instrument for high throughput measurement of material physical properties. JP2002-22630A. 2002 Jan 23.

Author

Hajduk, Damian (Inventor) ; Carlson, Eric (Inventor) ; Freitag, Christopher (Inventor) ; Kolosov, Oleg (Inventor). / Instrument for high throughput measurement of material physical properties. Patent No.: JP2002-22630A. Jan 23, 2002.

Bibtex

@misc{1027392c81ba4f3a89fcb23e98916af5,
title = "Instrument for high throughput measurement of material physical properties",
abstract = "A method for high throughput mechanical property and bulge testing of materials libraries. A plurality of samples on a substrate are monitored for their response to a force from a fluid.",
keywords = "high throughput screening, combinatorial materials discovery, polymers, films, mechanical property, parallel measurements",
author = "Damian Hajduk and Eric Carlson and Christopher Freitag and Oleg Kolosov",
year = "2002",
month = jan,
day = "23",
language = "English",
type = "Patent",
note = "JP2002-22630A; GO1D 1/16; GO1D 7/02; GO1N 3/00; GO1N 3/24; GO1M 7/00",

}

RIS

TY - PAT

T1 - Instrument for high throughput measurement of material physical properties

AU - Hajduk, Damian

AU - Carlson, Eric

AU - Freitag, Christopher

AU - Kolosov, Oleg

PY - 2002/1/23

Y1 - 2002/1/23

N2 - A method for high throughput mechanical property and bulge testing of materials libraries. A plurality of samples on a substrate are monitored for their response to a force from a fluid.

AB - A method for high throughput mechanical property and bulge testing of materials libraries. A plurality of samples on a substrate are monitored for their response to a force from a fluid.

KW - high throughput screening

KW - combinatorial materials discovery

KW - polymers

KW - films

KW - mechanical property

KW - parallel measurements

M3 - Patent

M1 - JP2002-22630A

ER -