Final published version, 1.79 MB, PDF document
Research output: Patent
Research output: Patent
}
TY - PAT
T1 - Instrument for high throughput measurement of material physical properties and method of using same
AU - Hajduk, Damian
AU - Carlson, Eric
AU - Freitag, Christopher
AU - Kolosov, Oleg
AU - Engstrom, James
AU - Safir, Adam
AU - Shrinivasan, Ravi
AU - Matsiev, L
N1 - Issued Aug. 30, 2005
PY - 2002/3/14
Y1 - 2002/3/14
N2 - An apparatus and method for screening combinatorial librariesof materials by measuring the response of individual library members to mechanical perturbations is described. The apparatus generally includes a sample holder for containing the library members, an array of probes for mechanically perturbing individual library members, and an array ofsensors for measuring the response of each of the library members to the mechanical perturbations. Library members undergoing screening make up a sample array, and individual library members constitute elements of the samplearray that are confined to specific locations on the sample holder. During screening, the apparatus mechanically perturbs individual library members by displacing the sample array (sample holder) and the array of probes. Typically, all of the elements of the sample array are perturbed simultaneously, but the apparatus also can also perturb individual or groups of sample array elements sequentially. The flexible apparatus and method can screen libraries of aterials based on many different bulk physical properties, including Young's modulus (flexure, uniaxial extension, biaxial compression, and shear); hardness (indentation), failure (stress and strain at failure, toughness), adhesion (tack, loop tack), and flow (viscosity, melt flow indexing, and rheology), among others.
AB - An apparatus and method for screening combinatorial librariesof materials by measuring the response of individual library members to mechanical perturbations is described. The apparatus generally includes a sample holder for containing the library members, an array of probes for mechanically perturbing individual library members, and an array ofsensors for measuring the response of each of the library members to the mechanical perturbations. Library members undergoing screening make up a sample array, and individual library members constitute elements of the samplearray that are confined to specific locations on the sample holder. During screening, the apparatus mechanically perturbs individual library members by displacing the sample array (sample holder) and the array of probes. Typically, all of the elements of the sample array are perturbed simultaneously, but the apparatus also can also perturb individual or groups of sample array elements sequentially. The flexible apparatus and method can screen libraries of aterials based on many different bulk physical properties, including Young's modulus (flexure, uniaxial extension, biaxial compression, and shear); hardness (indentation), failure (stress and strain at failure, toughness), adhesion (tack, loop tack), and flow (viscosity, melt flow indexing, and rheology), among others.
KW - high throughput screening
KW - combinatorial materials discovery
KW - polymers
KW - films
KW - mechanical property
KW - parallel measurements
M3 - Patent
M1 - US6936471
ER -