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Instrument for high throughput measurement of material physical properties and method of using same

Research output: Patent

Published

Standard

Instrument for high throughput measurement of material physical properties and method of using same. / Hajduk, Damian (Inventor); Carlson, Eric (Inventor); Freitag, Christopher (Inventor); Kolosov, Oleg (Inventor); Engstrom, James (Inventor); Safir, Adam (Inventor); Shrinivasan, Ravi (Inventor); Matsiev, L (Inventor).

Patent No.: US6936471. Mar 14, 2002.

Research output: Patent

Harvard

Hajduk, D, Carlson, E, Freitag, C, Kolosov, O, Engstrom, J, Safir, A, Shrinivasan, R & Matsiev, L Mar. 14 2002, Instrument for high throughput measurement of material physical properties and method of using same, Patent No. US6936471.

APA

Hajduk, D., Carlson, E., Freitag, C., Kolosov, O., Engstrom, J., Safir, A., Shrinivasan, R., & Matsiev, L. (2002). Instrument for high throughput measurement of material physical properties and method of using same. (Patent No. US6936471).

Vancouver

Hajduk D, Carlson E, Freitag C, Kolosov O, Engstrom J, Safir A et al, inventors. Instrument for high throughput measurement of material physical properties and method of using same. US6936471. 2002 Mar 14.

Author

Hajduk, Damian (Inventor) ; Carlson, Eric (Inventor) ; Freitag, Christopher (Inventor) ; Kolosov, Oleg (Inventor) ; Engstrom, James (Inventor) ; Safir, Adam (Inventor) ; Shrinivasan, Ravi (Inventor) ; Matsiev, L (Inventor). / Instrument for high throughput measurement of material physical properties and method of using same. Patent No.: US6936471. Mar 14, 2002.

Bibtex

@misc{ae839c38dcf8463b8b65a65e4b3c486e,
title = "Instrument for high throughput measurement of material physical properties and method of using same",
abstract = "An apparatus and method for screening combinatorial librariesof materials by measuring the response of individual library members to mechanical perturbations is described. The apparatus generally includes a sample holder for containing the library members, an array of probes for mechanically perturbing individual library members, and an array ofsensors for measuring the response of each of the library members to the mechanical perturbations. Library members undergoing screening make up a sample array, and individual library members constitute elements of the samplearray that are confined to specific locations on the sample holder. During screening, the apparatus mechanically perturbs individual library members by displacing the sample array (sample holder) and the array of probes. Typically, all of the elements of the sample array are perturbed simultaneously, but the apparatus also can also perturb individual or groups of sample array elements sequentially. The flexible apparatus and method can screen libraries of aterials based on many different bulk physical properties, including Young's modulus (flexure, uniaxial extension, biaxial compression, and shear); hardness (indentation), failure (stress and strain at failure, toughness), adhesion (tack, loop tack), and flow (viscosity, melt flow indexing, and rheology), among others. ",
keywords = "high throughput screening, combinatorial materials discovery, polymers, films, mechanical property, parallel measurements",
author = "Damian Hajduk and Eric Carlson and Christopher Freitag and Oleg Kolosov and James Engstrom and Adam Safir and Ravi Shrinivasan and L Matsiev",
note = "Issued Aug. 30, 2005; US6936471; GO1N 3/00",
year = "2002",
month = mar,
day = "14",
language = "English",
type = "Patent",

}

RIS

TY - PAT

T1 - Instrument for high throughput measurement of material physical properties and method of using same

AU - Hajduk, Damian

AU - Carlson, Eric

AU - Freitag, Christopher

AU - Kolosov, Oleg

AU - Engstrom, James

AU - Safir, Adam

AU - Shrinivasan, Ravi

AU - Matsiev, L

N1 - Issued Aug. 30, 2005

PY - 2002/3/14

Y1 - 2002/3/14

N2 - An apparatus and method for screening combinatorial librariesof materials by measuring the response of individual library members to mechanical perturbations is described. The apparatus generally includes a sample holder for containing the library members, an array of probes for mechanically perturbing individual library members, and an array ofsensors for measuring the response of each of the library members to the mechanical perturbations. Library members undergoing screening make up a sample array, and individual library members constitute elements of the samplearray that are confined to specific locations on the sample holder. During screening, the apparatus mechanically perturbs individual library members by displacing the sample array (sample holder) and the array of probes. Typically, all of the elements of the sample array are perturbed simultaneously, but the apparatus also can also perturb individual or groups of sample array elements sequentially. The flexible apparatus and method can screen libraries of aterials based on many different bulk physical properties, including Young's modulus (flexure, uniaxial extension, biaxial compression, and shear); hardness (indentation), failure (stress and strain at failure, toughness), adhesion (tack, loop tack), and flow (viscosity, melt flow indexing, and rheology), among others.

AB - An apparatus and method for screening combinatorial librariesof materials by measuring the response of individual library members to mechanical perturbations is described. The apparatus generally includes a sample holder for containing the library members, an array of probes for mechanically perturbing individual library members, and an array ofsensors for measuring the response of each of the library members to the mechanical perturbations. Library members undergoing screening make up a sample array, and individual library members constitute elements of the samplearray that are confined to specific locations on the sample holder. During screening, the apparatus mechanically perturbs individual library members by displacing the sample array (sample holder) and the array of probes. Typically, all of the elements of the sample array are perturbed simultaneously, but the apparatus also can also perturb individual or groups of sample array elements sequentially. The flexible apparatus and method can screen libraries of aterials based on many different bulk physical properties, including Young's modulus (flexure, uniaxial extension, biaxial compression, and shear); hardness (indentation), failure (stress and strain at failure, toughness), adhesion (tack, loop tack), and flow (viscosity, melt flow indexing, and rheology), among others.

KW - high throughput screening

KW - combinatorial materials discovery

KW - polymers

KW - films

KW - mechanical property

KW - parallel measurements

M3 - Patent

M1 - US6936471

ER -