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Interatomic force microscope and sample observing method therefor

Research output: Patent

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Interatomic force microscope and sample observing method therefor. / YAMANAKA, K (Inventor); Kolosov, Oleg (Inventor); OGISO, H (Inventor) et al.
Patent No.: JP-6323834. Nov 25, 1994.

Research output: Patent

Harvard

YAMANAKA, K, Kolosov, O, OGISO, H, SATO, H & KODA, T Nov. 25 1994, Interatomic force microscope and sample observing method therefor, Patent No. JP-6323834.

APA

YAMANAKA, K., Kolosov, O., OGISO, H., SATO, H., & KODA, T. (1994). Interatomic force microscope and sample observing method therefor. (Patent No. JP-6323834).

Vancouver

YAMANAKA K, Kolosov O, OGISO H, SATO H, KODA T, inventors. Interatomic force microscope and sample observing method therefor. JP-6323834. 1994 Nov 25.

Author

YAMANAKA, K (Inventor) ; Kolosov, Oleg (Inventor) ; OGISO, H (Inventor) et al. / Interatomic force microscope and sample observing method therefor. Patent No.: JP-6323834. Nov 25, 1994.

Bibtex

@misc{8125500ed3814150a6474e0989dd7569,
title = "Interatomic force microscope and sample observing method therefor",
abstract = "PURPOSE:To provide a measuring technology for interatomic microscope in which the irregular sample can be separated well from the frictional force. SOLUTION :An oscillating force applied laterally relatively between a sample 8 and a probe 4 Is provided. The sample 8 tilted laterally to excite bending orthogonal oscillation. The phase and the amplitude of the oscillation of the cantilever are detected.",
keywords = "Atomic force microscopy, nonlinearity, nanomechanics, nanotechnology",
author = "K YAMANAKA and Oleg Kolosov and H OGISO and H SATO and T KODA",
year = "1994",
month = nov,
day = "25",
language = "English",
type = "Patent",
note = "JP-6323834; G01B 11/30; G01B 21/30",

}

RIS

TY - PAT

T1 - Interatomic force microscope and sample observing method therefor

AU - YAMANAKA, K

AU - Kolosov, Oleg

AU - OGISO, H

AU - SATO, H

AU - KODA, T

PY - 1994/11/25

Y1 - 1994/11/25

N2 - PURPOSE:To provide a measuring technology for interatomic microscope in which the irregular sample can be separated well from the frictional force. SOLUTION :An oscillating force applied laterally relatively between a sample 8 and a probe 4 Is provided. The sample 8 tilted laterally to excite bending orthogonal oscillation. The phase and the amplitude of the oscillation of the cantilever are detected.

AB - PURPOSE:To provide a measuring technology for interatomic microscope in which the irregular sample can be separated well from the frictional force. SOLUTION :An oscillating force applied laterally relatively between a sample 8 and a probe 4 Is provided. The sample 8 tilted laterally to excite bending orthogonal oscillation. The phase and the amplitude of the oscillation of the cantilever are detected.

KW - Atomic force microscopy

KW - nonlinearity

KW - nanomechanics

KW - nanotechnology

M3 - Patent

M1 - JP-6323834

ER -