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    Rights statement: http://journals.cambridge.org/action/displayJournal?jid=JMR The final, definitive version of this article has been published in the Journal, Journal of Materials Research, 28 (24), pp 3311-3321 2013, © 2013 Cambridge University Press.

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Multidimensional SPM applied for Nanoscale Conductance Mapping

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<mark>Journal publication date</mark>28/12/2013
<mark>Journal</mark>Journal of Materials Research
Issue number24
Volume28
Number of pages11
Pages (from-to)3311-3321
Publication statusPublished
Early online date20/12/13
Original languageEnglish

Abstract

A new approach has been developed for nanoscale conductance mapping (NCM) based on multidimensional atomic force microscopy (AFM) to efficiently investigate the nanoscale electronic properties of heterogeneous surfaces. The technique uses a sequence of conductive AFM images, all acquired in a single area but each with incrementally higher applied voltages. This generates a matrix of current versus voltage (I–V) spectra, providing nanoscale maps of conductance and current nonlinearities with negligible spatial drift. For crystalline and amorphous phases of a GeSe chalcogenide phase change film, conductance and characteristic amorphous phase “turn-on” voltages are mapped with results providing traditional point-by-point I–V measurements, but acquired hundreds of times faster. Although similar to current imaging tunneling spectroscopy in a scanning tunneling microscope, the NCM technique does not require conducting specimens. It is therefore a promising approach for efficient, quantitative electronic investigations of heterogeneous materials used in sensors, resistive memories, and photovoltaics.

Bibliographic note

http://journals.cambridge.org/action/displayJournal?jid=JMR The final, definitive version of this article has been published in the Journal, Journal of Materials Research, 28 (24), pp 3311-3321 2013, © 2013 Cambridge University Press.