Rights statement: http://journals.cambridge.org/action/displayJournal?jid=JMR The final, definitive version of this article has been published in the Journal, Journal of Materials Research, 28 (24), pp 3311-3321 2013, © 2013 Cambridge University Press.
Final published version, 639 KB, PDF document
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Research output: Contribution to Journal/Magazine › Journal article › peer-review
}
TY - JOUR
T1 - Multidimensional SPM applied for Nanoscale Conductance Mapping
AU - Bosse, James L.
AU - Grishin, Ilja
AU - Kolosov, Oleg
AU - Huey, Bryan D.
N1 - http://journals.cambridge.org/action/displayJournal?jid=JMR The final, definitive version of this article has been published in the Journal, Journal of Materials Research, 28 (24), pp 3311-3321 2013, © 2013 Cambridge University Press.
PY - 2013/12/28
Y1 - 2013/12/28
N2 - A new approach has been developed for nanoscale conductance mapping (NCM) based on multidimensional atomic force microscopy (AFM) to efficiently investigate the nanoscale electronic properties of heterogeneous surfaces. The technique uses a sequence of conductive AFM images, all acquired in a single area but each with incrementally higher applied voltages. This generates a matrix of current versus voltage (I–V) spectra, providing nanoscale maps of conductance and current nonlinearities with negligible spatial drift. For crystalline and amorphous phases of a GeSe chalcogenide phase change film, conductance and characteristic amorphous phase “turn-on” voltages are mapped with results providing traditional point-by-point I–V measurements, but acquired hundreds of times faster. Although similar to current imaging tunneling spectroscopy in a scanning tunneling microscope, the NCM technique does not require conducting specimens. It is therefore a promising approach for efficient, quantitative electronic investigations of heterogeneous materials used in sensors, resistive memories, and photovoltaics.
AB - A new approach has been developed for nanoscale conductance mapping (NCM) based on multidimensional atomic force microscopy (AFM) to efficiently investigate the nanoscale electronic properties of heterogeneous surfaces. The technique uses a sequence of conductive AFM images, all acquired in a single area but each with incrementally higher applied voltages. This generates a matrix of current versus voltage (I–V) spectra, providing nanoscale maps of conductance and current nonlinearities with negligible spatial drift. For crystalline and amorphous phases of a GeSe chalcogenide phase change film, conductance and characteristic amorphous phase “turn-on” voltages are mapped with results providing traditional point-by-point I–V measurements, but acquired hundreds of times faster. Although similar to current imaging tunneling spectroscopy in a scanning tunneling microscope, the NCM technique does not require conducting specimens. It is therefore a promising approach for efficient, quantitative electronic investigations of heterogeneous materials used in sensors, resistive memories, and photovoltaics.
KW - AFM
KW - c-AFM
KW - PCM
KW - Phase change materials
KW - Nanoscale
KW - Conductance
U2 - 10.1557/jmr.2013.365
DO - 10.1557/jmr.2013.365
M3 - Journal article
VL - 28
SP - 3311
EP - 3321
JO - Journal of Materials Research
JF - Journal of Materials Research
SN - 2044-5326
IS - 24
ER -