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Optical identification using imperfections in 2D materials

Research output: Contribution to Journal/Magazine › Journal article › peer-review

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Optical identification using imperfections in 2D materials. / Cao, Yameng; Robson, Alexander James; Alharbi, Abdullah et al.
In: 2D Materials, Vol. 4, No. 4, 045021, 28.09.2017.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Cao, Y, Robson, AJ, Alharbi, A, Roberts, J, Woodhead, C, Noori, Y, Bernardo Gavito, R, Roedig, U, Falko, V & Young, RJ 2017, 'Optical identification using imperfections in 2D materials', 2D Materials, vol. 4, no. 4, 045021. https://doi.org/10.1088/2053-1583/aa8b4d

APA

Cao, Y., Robson, A. J., Alharbi, A., Roberts, J., Woodhead, C., Noori, Y., Bernardo Gavito, R., Roedig, U., Falko, V., & Young, R. J. (2017). Optical identification using imperfections in 2D materials. 2D Materials, 4(4), Article 045021. https://doi.org/10.1088/2053-1583/aa8b4d

Vancouver

Cao Y, Robson AJ, Alharbi A, Roberts J, Woodhead C, Noori Y et al. Optical identification using imperfections in 2D materials. 2D Materials. 2017 Sept 28;4(4):045021. Epub 2017 Sept 8. doi: 10.1088/2053-1583/aa8b4d

Author

Cao, Yameng ; Robson, Alexander James ; Alharbi, Abdullah et al. / Optical identification using imperfections in 2D materials. In: 2D Materials. 2017 ; Vol. 4, No. 4.

Bibtex

@article{c6e8754b45b84c9680d7ff60ce1358e0,
title = "Optical identification using imperfections in 2D materials",
abstract = "The ability to uniquely identify an object or device is important for authentication [1]. Imperfections, locked into structures during fabrication, can be used to provide a fingerprint that is challenging to reproduce. In this paper, we propose a simple optical technique to read unique information from nanometer-scale defects in 2D materials. Imperfections created during crystal growth or fabrication lead to spatial variations in the bandgap of 2D materials that can be characterized through photoluminescence measurements. We show a simple setup involving an angle- adjustable transmission filter, simple optics and a CCD camera can capture spatially- dependent photoluminescence to produce complex maps of unique information from 2D monolayers. Atomic force microscopy is used to verify the origin of the optical signature measured, demonstrating that it results from nanometer-scale imperfections. This solution to optical identification with 2D materials could be employed as a robust security measure to prevent counterfeiting.",
keywords = "Physically unclonable function, TMD, Security",
author = "Yameng Cao and Robson, {Alexander James} and Abdullah Alharbi and Jonny Roberts and Christopher Woodhead and Yasir Noori and {Bernardo Gavito}, Ramon and Utz Roedig and Vladimir Falko and Young, {Robert James}",
year = "2017",
month = sep,
day = "28",
doi = "10.1088/2053-1583/aa8b4d",
language = "English",
volume = "4",
journal = "2D Materials",
issn = "2053-1583",
publisher = "IOP Publishing Ltd.",
number = "4",

}

RIS

TY - JOUR

T1 - Optical identification using imperfections in 2D materials

AU - Cao, Yameng

AU - Robson, Alexander James

AU - Alharbi, Abdullah

AU - Roberts, Jonny

AU - Woodhead, Christopher

AU - Noori, Yasir

AU - Bernardo Gavito, Ramon

AU - Roedig, Utz

AU - Falko, Vladimir

AU - Young, Robert James

PY - 2017/9/28

Y1 - 2017/9/28

N2 - The ability to uniquely identify an object or device is important for authentication [1]. Imperfections, locked into structures during fabrication, can be used to provide a fingerprint that is challenging to reproduce. In this paper, we propose a simple optical technique to read unique information from nanometer-scale defects in 2D materials. Imperfections created during crystal growth or fabrication lead to spatial variations in the bandgap of 2D materials that can be characterized through photoluminescence measurements. We show a simple setup involving an angle- adjustable transmission filter, simple optics and a CCD camera can capture spatially- dependent photoluminescence to produce complex maps of unique information from 2D monolayers. Atomic force microscopy is used to verify the origin of the optical signature measured, demonstrating that it results from nanometer-scale imperfections. This solution to optical identification with 2D materials could be employed as a robust security measure to prevent counterfeiting.

AB - The ability to uniquely identify an object or device is important for authentication [1]. Imperfections, locked into structures during fabrication, can be used to provide a fingerprint that is challenging to reproduce. In this paper, we propose a simple optical technique to read unique information from nanometer-scale defects in 2D materials. Imperfections created during crystal growth or fabrication lead to spatial variations in the bandgap of 2D materials that can be characterized through photoluminescence measurements. We show a simple setup involving an angle- adjustable transmission filter, simple optics and a CCD camera can capture spatially- dependent photoluminescence to produce complex maps of unique information from 2D monolayers. Atomic force microscopy is used to verify the origin of the optical signature measured, demonstrating that it results from nanometer-scale imperfections. This solution to optical identification with 2D materials could be employed as a robust security measure to prevent counterfeiting.

KW - Physically unclonable function

KW - TMD

KW - Security

U2 - 10.1088/2053-1583/aa8b4d

DO - 10.1088/2053-1583/aa8b4d

M3 - Journal article

VL - 4

JO - 2D Materials

JF - 2D Materials

SN - 2053-1583

IS - 4

M1 - 045021

ER -