Submitted manuscript, 2.94 MB, PDF document
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Accepted author manuscript, 2.19 MB, PDF document
Available under license: CC BY
Submitted manuscript
Licence: Other
Final published version
Licence: CC BY
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Research output: Contribution to Journal/Magazine › Journal article › peer-review
}
TY - JOUR
T1 - Optical identification using imperfections in 2D materials
AU - Cao, Yameng
AU - Robson, Alexander James
AU - Alharbi, Abdullah
AU - Roberts, Jonny
AU - Woodhead, Christopher
AU - Noori, Yasir
AU - Bernardo Gavito, Ramon
AU - Roedig, Utz
AU - Falko, Vladimir
AU - Young, Robert James
PY - 2017/9/28
Y1 - 2017/9/28
N2 - The ability to uniquely identify an object or device is important for authentication [1]. Imperfections, locked into structures during fabrication, can be used to provide a fingerprint that is challenging to reproduce. In this paper, we propose a simple optical technique to read unique information from nanometer-scale defects in 2D materials. Imperfections created during crystal growth or fabrication lead to spatial variations in the bandgap of 2D materials that can be characterized through photoluminescence measurements. We show a simple setup involving an angle- adjustable transmission filter, simple optics and a CCD camera can capture spatially- dependent photoluminescence to produce complex maps of unique information from 2D monolayers. Atomic force microscopy is used to verify the origin of the optical signature measured, demonstrating that it results from nanometer-scale imperfections. This solution to optical identification with 2D materials could be employed as a robust security measure to prevent counterfeiting.
AB - The ability to uniquely identify an object or device is important for authentication [1]. Imperfections, locked into structures during fabrication, can be used to provide a fingerprint that is challenging to reproduce. In this paper, we propose a simple optical technique to read unique information from nanometer-scale defects in 2D materials. Imperfections created during crystal growth or fabrication lead to spatial variations in the bandgap of 2D materials that can be characterized through photoluminescence measurements. We show a simple setup involving an angle- adjustable transmission filter, simple optics and a CCD camera can capture spatially- dependent photoluminescence to produce complex maps of unique information from 2D monolayers. Atomic force microscopy is used to verify the origin of the optical signature measured, demonstrating that it results from nanometer-scale imperfections. This solution to optical identification with 2D materials could be employed as a robust security measure to prevent counterfeiting.
KW - Physically unclonable function
KW - TMD
KW - Security
U2 - 10.1088/2053-1583/aa8b4d
DO - 10.1088/2053-1583/aa8b4d
M3 - Journal article
VL - 4
JO - 2D Materials
JF - 2D Materials
SN - 2053-1583
IS - 4
M1 - 045021
ER -