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Simple digital only test approach for embedded charge-pump phase-locked loops.

Research output: Contribution to journalJournal article


Associated organisational unit

Journal publication date2001
JournalElectronics Letters
Number of pages2
Original languageEnglish


Techniques for a simple automated test approach for high performance fully embedded charge-pump phase-locked loops (CP-PLLs) are explained. The test approach is focused towards non-invasive high volume production testing of PLLs using digital only testers in conjunction with additional on-chip circuitry

Bibliographic note

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