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Simple digital only test approach for embedded charge-pump phase-locked loops.

Research output: Contribution to journalJournal article

Published

Associated organisational unit

Journal publication date2001
JournalIEE Electronics Letters
Journal number22
Volume37
Number of pages2
Pages1318-1319
Original languageEnglish

Abstract

Techniques for a simple automated test approach for high performance fully embedded charge-pump phase-locked loops (CP-PLLs) are explained. The test approach is focused towards non-invasive high volume production testing of PLLs using digital only testers in conjunction with additional on-chip circuitry

Bibliographic note

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