Submitted manuscript, 290 KB, PDF document
Available under license: CC BY-NC-ND
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter (peer-reviewed)
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter (peer-reviewed)
}
TY - CHAP
T1 - Test of A/D Converters
AU - Richardson, Andrew
AU - Lechner, Andreas
PY - 2008
Y1 - 2008
N2 - Converter testing is a complex process. Test specifications are application dependent and in most cases require sophisticated stimulus generation and, response analysis equipment. The processing of sampled data to generate specification measurements also requires complex DSP algorithms. Furthermore, test complexity increases with speed, resolution and technology advances. This chapter summaries the key test specifications, conventional methods of verifying these specifications and potential built in self test solutions.
AB - Converter testing is a complex process. Test specifications are application dependent and in most cases require sophisticated stimulus generation and, response analysis equipment. The processing of sampled data to generate specification measurements also requires complex DSP algorithms. Furthermore, test complexity increases with speed, resolution and technology advances. This chapter summaries the key test specifications, conventional methods of verifying these specifications and potential built in self test solutions.
KW - Analogue Test
KW - Mixed Signal Test
M3 - Chapter (peer-reviewed)
SN - 978-0-86341-745-0
SP - 213
EP - 234
BT - Test & Diagnostics of Analogue, Mixed Signal & RF Integrated Circuits
A2 - Sun, Yichuang
PB - IET Press
CY - Stevenage
ER -