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Test of A/D Converters

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter (peer-reviewed)

Published

Standard

Test of A/D Converters. / Richardson, Andrew; Lechner, Andreas.

Test & Diagnostics of Analogue, Mixed Signal & RF Integrated Circuits. ed. / Yichuang Sun. Stevenage : IET Press, 2008. p. 213-234.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter (peer-reviewed)

Harvard

Richardson, A & Lechner, A 2008, Test of A/D Converters. in Y Sun (ed.), Test & Diagnostics of Analogue, Mixed Signal & RF Integrated Circuits. IET Press, Stevenage, pp. 213-234. <http://www.theiet.org/resources/books/circuits/test-diagnosis.cfm>

APA

Richardson, A., & Lechner, A. (2008). Test of A/D Converters. In Y. Sun (Ed.), Test & Diagnostics of Analogue, Mixed Signal & RF Integrated Circuits (pp. 213-234). IET Press. http://www.theiet.org/resources/books/circuits/test-diagnosis.cfm

Vancouver

Richardson A, Lechner A. Test of A/D Converters. In Sun Y, editor, Test & Diagnostics of Analogue, Mixed Signal & RF Integrated Circuits. Stevenage: IET Press. 2008. p. 213-234

Author

Richardson, Andrew ; Lechner, Andreas. / Test of A/D Converters. Test & Diagnostics of Analogue, Mixed Signal & RF Integrated Circuits. editor / Yichuang Sun. Stevenage : IET Press, 2008. pp. 213-234

Bibtex

@inbook{8fc37aaca7ab4eb8a764f0f67b74e189,
title = "Test of A/D Converters",
abstract = "Converter testing is a complex process. Test specifications are application dependent and in most cases require sophisticated stimulus generation and, response analysis equipment. The processing of sampled data to generate specification measurements also requires complex DSP algorithms. Furthermore, test complexity increases with speed, resolution and technology advances. This chapter summaries the key test specifications, conventional methods of verifying these specifications and potential built in self test solutions. ",
keywords = "Analogue Test, Mixed Signal Test",
author = "Andrew Richardson and Andreas Lechner",
year = "2008",
language = "English",
isbn = "978-0-86341-745-0",
pages = "213--234",
editor = "Yichuang Sun",
booktitle = "Test & Diagnostics of Analogue, Mixed Signal & RF Integrated Circuits",
publisher = "IET Press",

}

RIS

TY - CHAP

T1 - Test of A/D Converters

AU - Richardson, Andrew

AU - Lechner, Andreas

PY - 2008

Y1 - 2008

N2 - Converter testing is a complex process. Test specifications are application dependent and in most cases require sophisticated stimulus generation and, response analysis equipment. The processing of sampled data to generate specification measurements also requires complex DSP algorithms. Furthermore, test complexity increases with speed, resolution and technology advances. This chapter summaries the key test specifications, conventional methods of verifying these specifications and potential built in self test solutions.

AB - Converter testing is a complex process. Test specifications are application dependent and in most cases require sophisticated stimulus generation and, response analysis equipment. The processing of sampled data to generate specification measurements also requires complex DSP algorithms. Furthermore, test complexity increases with speed, resolution and technology advances. This chapter summaries the key test specifications, conventional methods of verifying these specifications and potential built in self test solutions.

KW - Analogue Test

KW - Mixed Signal Test

M3 - Chapter (peer-reviewed)

SN - 978-0-86341-745-0

SP - 213

EP - 234

BT - Test & Diagnostics of Analogue, Mixed Signal & RF Integrated Circuits

A2 - Sun, Yichuang

PB - IET Press

CY - Stevenage

ER -