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Research

Dr Alexander Robson

Formerly at Lancaster University

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  1. Published

    Quantitative Measurements of Intrinsic Thermal Conductivity of Surface and Buried Nanoscale Layers via Cross-Sectional Scanning Thermal Microscopy – X-SThM

    Spiece, J., Evangeli, C., Robson, A. J., Robinson, B. J., Alzina, F. & Kolosov, O. V., 1/03/2017.

    Research output: Contribution to conference - Without ISBN/ISSN › Abstract › peer-review

  2. Published

    Novel nanoscale method for thermal conductivity measurements

    Spiece, J., Robson, A. J., Evangeli, C. & Kolosov, O. V., 3/07/2017. 3 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Abstract › peer-review

  3. Published

    Improving accuracy of nanothermal measurements via spatially distributed scanning thermal microscope probes

    Spiece, J., Evangeli, C., Lulla, K., Robson, A., Robinson, B. & Kolosov, O., 7/07/2018, In: Journal of Applied Physics. 124, 1, 7 p., 015101.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  4. Published

    Quantifying thermal transport in buried semiconductor nanostructures via Cross-Sectional Scanning Thermal Microscopy

    Spiece, J., Evangeli, C., Robson, A., Sachat, A., Hanel, L., Alonso, M., Garriga, M., Robinson, B., Oehme, M., Schulze, J., Alzina, F., Sotomayor-Torres, C. M. & Kolosov, O., 28/06/2021, In: Nanoscale. 13, 24, p. 10829-10836 8 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  5. Published

    Low leakage-current InAsSb nanowire photodetectors on silicon

    Thompson, M. D., Alhodaib, A., Craig, A. P., Robson, A. J., Aziz, A., Krier, A., Svensson, J., Wernersson, L., Sanchez, A. M. & Marshall, A. R. J., 13/01/2016, In: Nano Letters. 16, 1, p. 182-187 6 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  6. Published

    A detailed comparison of measured and simulated optical properties of a short-period GaAs/AlxGa1-xAs distributed Bragg reflector

    Wilson, T., Hodgson, P., Robson, A., Jackson, C., Grew, B. & Hayne, M., 25/03/2020, In: Semiconductor Science and Technology. 35, 5, 6 p., 055003.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

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