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Professor Andrew Richardson

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  1. 1998
  2. Published

    Design for testability strategies for mixed signal and analogue designs: from layout to system.

    Richardson, A. M. D., Lechner, A. & Olbrich, T., 1998, Proceedings of the 5th IEEE international conference on electronics, circuits and systems. Lisbon, p. 425-433 9 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  3. 1997
  4. Published

    Reconfigurable smart sensors for dependable systems

    Sharif, E., Richardson, A. & Dorey, T., 1/11/1997, Hardware Systems for Dependable Applications (Digest No: 1997/335), IEE Half-Day Colloquium on. IEEE, p. 2/1 -2/6 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  5. Published

    Integrating testability into microsystems

    Olbrich, T., Richardson, A., Vermeiren, W. & Straube, B., 02/1997, In: Microsystem Technologies. 3, 2, p. 72-79 8 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  6. Published

    A new methodology for IC product quality estimation.

    Olbrich, T., Grout, I., Eben Aimine, Y., Richardson, A. & Contensou, J., 1997, Proceedings of the European design and test conference (ED&TC '97). Paris: IEEE Computer Society Press

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  7. Published

    A new quality estimation methodology for mixed-signal and analogue ICs

    Olbrich, T., Grout, I. A., Aimine, Y. E., Richardson, A. M. & Contensou, J., 1997, European Design and Test Conference, 1997. ED&TC 97. Proceedings . LOS ALAMITOS: I E E E, COMPUTER SOC PRESS, p. 573-580 8 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  8. Published

    Current-mode techniques for self-testing analogue circuits

    Baturone, I., SanchezSolano, S., Richardson, A. M. & Huertas, J. L., 1997, IDDQ Testing, 1997. Digest of Papers., IEEE International Workshop on . Jayasumana, A. & Tong, C. (eds.). LOS ALAMITOS: I E E E, COMPUTER SOC PRESS, p. 33-37 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  9. Published

    Fault-tolerant and self-testable architectures for zero failure electronics

    Richardson, A., Sharif, E. & Betts, W. R., 1997, AUTOMOTIVE ELECTRONICS - AUTOTECH'97. EDMUNDS: MECHANICAL ENGINEERING PUBL, p. 133-142 10 p. (IMechE seminar publication ; 1997-10).

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  10. 1996
  11. Published

    Design-for-test (DfT) study on a current mode DAC

    Olbrich, T., Mozuelos, R., Richardson, A. & Bracho, S., 12/1996, In: IEE Proceedings - Circuits, Devices and Systems. 143, 6, p. 374-379 6 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  12. Published

    Editorial: Mixed signal & analogue IC test technology

    Richardson, A. & Dorey, T., 12/1996, In: IEE Proceedings - Circuits, Devices and Systems. 143, 6, p. 357-357 1 p.

    Research output: Contribution to Journal/Magazine › Editorial › peer-review

  13. Published

    Mixed signal test - Techniques, applications and demands

    Baker, K., Richardson, A. M. & Dorey, A. P., 12/1996, In: IEE Proceedings - Circuits, Devices and Systems. 143, 6, p. 358-365 8 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

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