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Professor Andrew Richardson

Professor

  1. 2019
  2. Published

    Self-Monitoring, Self-Healing Biomorphic Sensor Technology

    Richardson, A. & Cheneler, D., 3/10/2019, 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019. Gizopoulos, D., Alexandrescu, D., Papavramidou, P. & Maniatakos, M. (eds.). IEEE, p. 121-124 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  3. 2017
  4. Published

    Development of a multi frequency impedance measurement system for use in MEMS flow cytometers

    Richardson, A. M. D., Cole, N. & Abdul‑Hafiz, A., 12/2017, In: Microsystem Technologies. 23, 12, p. 5527-5543 17 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  5. Published

    A housekeeping prognostic health management framework for microfluidic systems

    Khan, H., Al-Gayem, Q. & Richardson, A. M. D., 1/06/2017, In: IEEE Transactions on Device and Materials Reliability. 17, 2, p. 438-449 12 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  6. 2016
  7. Published

    Use of self-calibration data for multifunctional MEMS sensor prognostics

    Khan, H., Tahir, M. I. & Richardson, A. M. D., 08/2016, In: Journal of Micromechanical Systems. 25, 4, p. 761-769 9 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  8. 2013
  9. Published

    Scanning the strength of a test signal to monitor electrode degradation within bio-fluidic microsystems

    Al-Gayem, Q., Liu, H., Khan, H. & Richardson, A., 2013, On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International. IEEE, p. 133-138 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  10. 2011
  11. Published

    Move from Online Test to Fault-tolerant: Design and Simulation of a Multi-Functional MEMS Sensor

    Xu, Z., Richardson, A., Begbie, M. & Wang, C., 16/05/2011, Proceedings of the IEEE International Mixed Signals, Sensors and Systems Test Workshop. USA: IEEE COMPUTER SOC, p. 88-95 8 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  12. Published

    An oscillation-based technique for degradation monitoring of sensing and actuation electrodes within microfluidic systems.

    Al-Gayem, Q., Richardson, A., Liu, H. & Burd, N., 02/2011, In: Journal of Electronic Testing. 27, 3, p. 375-387 13 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  13. Published

    Test strategies for electrode degradation in bio-fluidic microsystems.

    Al-Gayem, Q., Honguan, L., Richardson, A. & Burd, N., 02/2011, In: Journal of Electronic Testing. 27, 1, p. 57-68 12 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  14. 2010
  15. Published

    An on-line monitoring technique for electrode degradation in bio-fluidic microsystems.

    Al-Gayem, Q., Liu, H., Richardson, A. M. D., Burd, N. & Kumar, M., 10/2010, Proceedings of the 2010 IEEE International Test Conference (ITC). Austin, Texas: IEEE, p. 1-10 10 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  16. Published

    A multi-mode MEMS sensor design to support system test and health & usage monitoring applications

    Xu, Z., Richardson, A., Koltsov, D., Li, L., Begbie, M. & Wang, C., 1/05/2010, Test Symposium (ETS), 2010 15th IEEE European. p. 263 1 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  17. Published

    Design and simulation of a multi-function MEMS sensor for health and usage monitoring.

    Xu, Z., Kotsov, D., Richardson, A., Li, L. & Begbie, M., 12/01/2010, In: Proceedings of IEEE Prognostics & System Health Management Conference. p. 1-7 7 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  18. 2009
  19. Published

    Integrated sensors for health monitoring in advanced electronic systems

    Wang, C. H., Liu, Y., Desmulliez, M. & Richardson, A., 1/11/2009, Design and Test Workshop (IDT), 2009 4th International. IEEE, p. 1-6 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  20. Published

    Special Issue: Mixed-Technology Testing

    Lubaszewski, M. (Editor), Richardson, A. (Editor) & Su, C. C. (Editor), 07/2009, In: Microelectronics Journal. 40, 7, p. 1041-1041 1 p.

    Research output: Contribution to Journal/MagazineEditorialpeer-review

  21. Published

    Built-in Test Solutions for the Electrode Structures in Bio-Fluidic Microsystems

    Al-Gayem, Q., Liu, H., Richardson, A. & Burd, N., 2009, ETS 2009: EUROPEAN TEST SYMPOSIUM, PROCEEDINGS. LOS ALAMITOS: IEEE COMPUTER SOC, p. 73-78 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  22. Published

    Health monitoring of aircraft wiring by acoustic method

    Saha, S., Xu, Z., Koltsov, D., Richardson, A. & Sutherland, A., 2009, 2009 IEEE AEROSPACE CONFERENCE, VOLS 1-7. NEW YORK: IEEE, p. 3744-3753 10 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  23. 2008
  24. Published

    Online Testing of MEMS Based on Encoded Stimulus Superposition.

    Dumas, N., Xu, Z., Georgopolis, K., Bunyan, J. & Richardson, A., 12/2008, In: Journal of Electronic Testing. 24, 6, p. 555-566 12 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  25. Published

    Microsystems for structural health monitoring.

    Richardson, A., Van Heeren, H. & Neylon, S., 10/2008, European Commission.

    Research output: Book/Report/ProceedingsCommissioned report

  26. Published

    Acoustic system for online wiring test on aircraft.

    Xu, Z., Koltsov, D., Richardson, A. & Sutherland, A., 18/06/2008, IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop, 2008. IMS3TW 2008.. IEEE, p. 1-4 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  27. Published

    Failure mechanisms of legacy aircraft wiring and interconnects

    Moffat, B. G., Abraham, E., Desmulliez, M. P. Y., Koltsov, D. & Richardson, A., 06/2008, In: IEEE Transactions on Dielectrics and Electrical Insulation. 15, 3, p. 808-822 15 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  28. Published

    Delivering Bio-Mems & Microfluidic Education Around Accessible Technologies

    Richardson, A., Liu, H., Koltsov, D., Rosing, R., Ryan, T. & Wooton, R., 28/05/2008, Proceedings of the 8th European Workshop on Microelectronics Education. EDA Publishing, 2 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  29. Published

    A Dependable Microelectronic Peptide Synthesizer Using Electrode Data

    Richardson, A., Kerkhoff, H. G., Zhang, X., Mailly, F., Nouet, P. & Liu, H., 2008, In: VLSI Design. 2008, n/a, 9 p., 437879.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  30. Published

    A novel method for test and calibration of capacitive accelerometers with a fully electrical setup

    Dumas, N., Azaies, F., Mailly, F., Richardson, A. & Nouet, P., 2008, Design and Diagnostics of Electronic Circuits and Systems, 2008. DDECS 2008. 11th IEEE Workshop on . Straube, B., Drutarovsky, M., Renovell, M., Gramata, P. & Fischerova, M. (eds.). LOS ALAMITOS: IEEE COMPUTER SOC, p. 304-309 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  31. Published

    An Embedded Test & Health Monitoring Strategy for Detecting and Locating Faults in Aerospace Bus Systems.

    Hannu, J., Koltsov, D., Xu, Z., Richardson, A. & Moilanen, M., 2008, In: Proceedings of the IEEE .

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  32. Published

    Embedded Health Monitoring Strategies for Aircraft Wiring Systems

    Xu, Z., Saha, S., Koltsov, D., Richardson, A., Honary, B., Hannu, J., Sutherland, A., Moffat, B. G. & Desmulliez, M. P. Y., 2008, ESTC 2008: 2ND ELECTRONICS SYSTEM-INTEGRATION TECHNOLOGY CONFERENCE, VOLS 1 AND 2, PROCEEDINGS. NEW YORK: IEEE, p. 463-469 7 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  33. Published

    Embedded Test & Health Monitoring Strategies for Bio-Fluidic Microystems

    Liu, H., Richardson, A., Harvey, T. G., Ryan, T. & Pickering, C., 2008, ESTC 2008: 2ND ELECTRONICS SYSTEM-INTEGRATION TECHNOLOGY CONFERENCE, VOLS 1 AND 2, PROCEEDINGS. NEW YORK: IEEE, p. 427-433 7 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  34. Published

    Model based design optimization of micromechanical systems, based on the Cosserat theory

    Wiegand, T., Peters, D., Laur, R., Rosing, R., Richardson, A., Del Sarto, M. & Baldo, L., 2008, PROCEEDINGS OF THE 11TH INTERNATIONAL CONFERENCE ON OPTIMIZATION OF ELECTRICAL AND ELECTRONIC EQUIPMENT, VOL I. Cernat, M. (ed.). NEW YORK: IEEE, p. 33-38 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  35. Published

    Phase Locked Loop Test Methodology

    Richardson, A. & Burbidge, M., 2008, Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits. Sun, Y. (ed.). Stevenage: IET Press, p. 277-306 30 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter (peer-reviewed)

  36. Published

    Test of A/D Converters

    Richardson, A. & Lechner, A., 2008, Test & Diagnostics of Analogue, Mixed Signal & RF Integrated Circuits. Sun, Y. (ed.). Stevenage: IET Press, p. 213-234 22 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter (peer-reviewed)

  37. 2007
  38. Published

    Guest Editorial

    Lubaszewski, M. (Editor), Richardson, A. (Editor) & Su, C. C. (Editor), 12/2007, In: Journal of Electronic Testing. 23, 6, p. 469-469 1 p.

    Research output: Contribution to Journal/MagazineEditorialpeer-review

  39. Published

    A fault-tolerant MEF peptide synthesizer using control and direct sensing electrodes employing current and impedance tests

    Zhang, X., Kerkhoff, H. G., Mailly, F., Nouet, P., Liu, H. & Richardson, A., 1/06/2007, 13th International mixed signals testing workshop and 3rd international GHz/Gbps test workshop, Póvoa de Varzim, Portugal. Portugal: University of Porto, p. 176-181 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  40. Published

    Self-testing of micro-electrode array implemented as a bio-sensor

    Liu, H., Dumas, N. & Richardson, A., 1/06/2007, 13th International mixed signals testing workshop and 3rd international GHz/Gbps test workshop. Póvoa de Varzim, Portugal: IEEE Portugal section, p. 166-170 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  41. Published

    Sensor Testing Through Bias Superposition.

    Richardson, A. M. D., Bunyan, R., Mathias, H. & Nouet, P., 1/05/2007, In: Sensors and Actuators A: Physical. 136, 1, p. 441-455 15 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  42. Published

    Online sensor testing through superposition of encoded stimulus.

    Dumas, N., Xu, Z., Georgopoulos, K., Bunyan, J. & Richardson, A., 04/2007, Proceedings of the Design, Test, Integration and Packaging of MEMS/MOEMS, Stresa, Lago Maggiore, Italy, 25-27 April 2007.. 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  43. Published

    System in Package Technology - Design for Manufacture Challenges.

    Richardson, A. M. D., Bailey, C., Dumas, N. & Yannou, J. M., 1/02/2007, In: Circuit World. 33, 1, p. 36-46 11 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  44. Published

    A novel approach for online sensor testing based on an encoded test stimulus

    Dumas, N., Xu, Z., Georgopoulos, K., Bunyan, R. J. T. & Richardson, A., 2007, ETS 2007: 12th IEEE European Test Symposium, Proceedings. LOS ALAMITOS: IEEE COMPUTER SOC, p. 105-110 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  45. 2006
  46. Published

    Guest editorial.

    Richardson, A. M. D., Mir, S. & Cheng, T., 12/2006, In: Journal of Electronic Testing. 22, 4-6, p. 311

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  47. Published

    Investigation into the use of hybrid solutions for high resolution A/D converter testing.

    Lechner, A., Georgopoulos, K., Burbidge, M. & Richardson, A., 12/2006, In: Journal of Electronic Testing. 22, 4-6, p. 359-370 12 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  48. Published

    A capacitance and optical method for the static and dynamic characterization of micro electro mechanical systems (MEMS) devices.

    Richardson, A. M. D., Ferraris, E., Fassi, I., De Masi, B. & Rosing, R., 1/09/2006, In: Microsystem Technologies. 12, 10-11, p. 1053-1061 9 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  49. Published

    Built-in test of electrode degradation of multi-electrode array biosensors

    Liu, H., Dumas, N., Richardson, A., Heal, R. & Kerkhoff, H. G., 1/06/2006, Proceedings of the 12th IEEE International mixed signal testing workshop (IMSTW'06), Edinburgh, United Kingdom. Lancaster, UK: ISLI en Lancaster University, p. 136-141 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  50. Published

    Towards a health monitor for system in package with MEMS functionality.

    Dumas, N. & Richardson, A., 06/2006. 6 p.

    Research output: Contribution to conference - Without ISBN/ISSN Conference paperpeer-review

  51. Published

    Design for Micro and Nano Manufacture; The "PATENT-DfMM Network of Excellence: Modelling and Simulation Cluster

    Richardson, A., Slattery, O. & Rencz, M., 1/04/2006, Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2006. EuroSime 2006. 7th International Conference on. p. 1 -5 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  52. Published

    Bit-stream manipulation for SD modulator failure mode analysis.

    Burbidge, M., Georgopoulos, K., Lechner, A. & Richardson, A., 2006, Proceedings of the 11th IEEE European test symposium..

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  53. Published

    Bringing Multi-Domain Functions to Intelligent Systems through MEMS Technology Platforms – The INTEGRAMplus Access Service.

    Richardson, A., Pickering, C., McNie, M., Reeves, C., Schropfer, G., Knapp, H. & Bosshard, C., 2006, In: MST News (VDI/VDE Technologiezentrum Informationstechnic). 4, p. 38-40 3 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  54. Published
  55. Published

    INTEGRAMplus : a new European service project providing development platforms for integrated micro-nano technologies and products.

    Richardson, A. M. D., Pickering, C., McNie, M. & Reeves, C. L., 2006, In: MST News (VDI/VDE Technologiezentrum Informationstechnic).

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  56. Published

    MNT needs methodologies and software tools.

    Richardson, A. M. D., Solomon, P. & El-Fatatry, A., 2006, In: MST News (VDI/VDE Technologiezentrum Informationstechnic). 2, p. 16-35 20 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  57. Published

    Modelling the behaviour of soldier joints for wafer level SIP.

    Liu, H., Strusevich, N., Stoyanov, S., Bailey, C., Richardson, A. M. D., Dumas, N., Yannou, J. M. & Georgel, V., 2006, Proceedings of the 8th IEEE electronics packaging technology conference..

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  58. 2005
  59. Published

    The integration of on-line monitoring and reconfiguration functions into a safety critical automotive electronic control unit.

    Jeffery, C., Cutajar, R., Richardson, A. M. D., Prosser, S., Lickess, M. & Riches, S., 08/2005, In: Journal of Electronic Testing. 21, 4, p. 405-416 12 p.

    Research output: Contribution to Journal/MagazineJournal article

  60. Published

    Design and Test of an Oscillation-based System Architecture for DNA Sensor Arrays

    Liu, H., Kerkhoff, H. G., Richardson, A., Zhang, X., Nouet, P. & Azais, F., 1/06/2005, Proceedings of 11th International Mixed Signal Test Workshop, Cannes, France. France: TIMA Laboratory, p. 1-6 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  61. Published

    Behavioural error injection, spectral analysis and error detection for a 4th order single-loop sigma-delta converter using Walsh transforms.

    Georgopoulos, K., Burbidge, M., Lechner, A. & Richardson, A. M. D., 2005, Proceedings of the ETS workshop on Testing of High Resolution Mixed Signal Interfaces.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  62. Published

    Bias superposition: an on-line test strategy for a MEMS based conductivity sensor

    Jeffrey, C., Xu, Z. & Richardson, A., 2005, ETS 2005:10th IEEE European Test Symposium, Proceedings. LOS ALAMITOS: IEEE COMPUTER SOC, p. 88-93 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  63. Published

    Design Considerations for On-line Testing of a Capacitive Accelerometer.

    Jeffery, C., Bunyan, R. J. T., Combes, D., King, D. O. & Richardson, A. M. D., 2005, Proceedings of the 11th IEEE International Mixed-Signals Testing Workshop. p. 220-223 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  64. Published

    Investigation into the Use of Alternative Transformation Techniques for High-Resolution A/D Converter Testing.

    Georgopoulos, K., Burbidge, M., Lechner, A. & Richardson, A. M. D., 2005, Proceedings of the IEEE Mixed Signal Test Workshop.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  65. Published

    The integration of on-line monitoring and reconfiguration functions using IEEE1149.4 into a safety critical automotive electronic control unit.

    Jeffery, C., Cutajar, R., Richardson, A. M. D., Prosser, S., Lickess, M. & Riches, S., 2005, Proceedings of Design, Automation and Test in Europe, 2005.. Vol. 3. p. 153-158 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  66. Published

    Using bias superposition to test a thick film conductance sensor.

    Jeffery, C., Zhou, X. & Richardson, A. M. D., 2005, In: Journal of Physics: Conference Series. 15, p. 161-166 6 p.

    Research output: Contribution to Journal/MagazineJournal article

  67. Published

    VHDL-AMS fault simulation for testing DNA bio-sensing arrays

    Kerkhoff, H. G., Zhang, X., Liu, H., Richardson, A., Nouet, P. & Azais, F., 2005, 2005 IEEE SENSORS. NEW YORK: IEEE, p. 1030-1033 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  68. 2004
  69. Published

    Construction of Nonlinear Dynamic MEMS Component Models Using Cosserat Theory.

    Richardson, A., De Masi, B., Rosing, R. & Wang, C., 1/08/2004, In: Analog Integrated Circuits and Signal Processing. 40, 2, p. 117-130 14 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  70. Published

    Testing high resolution SD ADC’s by using the noise transfer function

    Richardson, A. & De-Venuto, D., 26/05/2004. 0 p.

    Research output: Contribution to conference - Without ISBN/ISSN Conference paperpeer-review

  71. Published

    Flexible embedded test solution for high-speed analogue front-end architectures.

    Lechner, A., Burbidge, M. J. & Richardson, A. M. D., 2004, In: IEE Proceedings - Circuits, Devices and Systems. 151, 4, p. 359-369 11 p.

    Research output: Contribution to Journal/MagazineJournal article

  72. Published

    Motivations and techniques of built in self-test for embedded frequency synthesis systems incorporating charge pump phase-locked loops.

    Burbidge, M., Lechner, A., Bell, G. & Richardson, A. M. D., 2004, IEE proceedings - circuits, devices and systems. 4 ed. Vol. 151. p. 337-348 12 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  73. 2003
  74. Published

    Techniques for automatic on chip closed loop transfer function monitoring for embedded charge pump phase locked loops.

    Burbidge, M. J., Tijou, J. & Richardson, A. M. D., 19/12/2003, Design, Automation and Test in Europe Conference and Exhibition, 2003. p. 496-501 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  75. Published

    Investigations for minimum invasion digital only built in ‘ramp’ based test techniques for charge pump PLLs.

    Burbidge, M. J., Poullet, F., Tijou, J. & Richardson, A. M. D., 08/2003, In: Journal of Electronic Testing. 19, 4, p. 481-490 10 p.

    Research output: Contribution to Journal/MagazineJournal article

  76. Published

    Construction of nonlinear dynamic MEMS component models using cosserat theory.

    Wang, C., Richardson, A. M. D., Liu, D., Rosing, R., Tucker, R. & De Masi, B., 05/2003, Proceedings of the SPIE design, test, integration and packaging of MEMS symposium. France: Cannes Mandelieu

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  77. Published

    Evaluation and detection of deterministic jitter causes in CP-PLLs due to macro level faults and pre-detection using simple methods.

    Burbidge, M. J., Lechner, A. & Richardson, A. M. D., 2003, In: Proceedings of the 9th IEEE international mixed signal test workshop (IMSTW03). p. 157-164 8 p.

    Research output: Contribution to Journal/MagazineJournal article

  78. Published

    Investigations into testability improvements on a 16 bit audio sigma-delta ADC through the use of on-chip techniques.

    De Venuto, D., Compagne, E. & Richardson, A. M. D., 2003, Proceedings of IMSTW 2003.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  79. Published

    Investigations of automatic built in transient step response monitoring for embedded second order charge pump phase locked loop frequency synthesizers.

    Burbidge, M. J., Tijou, J. & Richardson, A. M. D., 2003, In: Journal of Electronic Testing.

    Research output: Contribution to Journal/MagazineJournal article

  80. Published

    Modelling techniques for reliability prediction in MEMS technologies.

    Rosing, R. & Richardson, A. M. D., 2003, Proceedings of the Nanotech 2003 conference.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  81. Published

    Online monitoring for automotive sub-systems using 1149.4.

    Jeffrey, C., Lechner, A. & Richardson, A. M. D., 2003, EPRINTS-BOOK-TITLE. 1.3 ed.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  82. Published

    Re-using IEEE1149.4 as an infrastructure for online monitoring.

    Jeffrey, C., Lechner, A. & Richardson, A. M. D., 2003, Proceedings of the 9th IEEE international mixed signal test workshop (IMSTW03). p. 247-249 3 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  83. 2002
  84. Published

    Investigations of automatic built in transient step response monitoring for embedded second order charge pump phase locked loop frequency synthesizers

    Richardson, A., Tijou, J., Burbidge, M. & Vaid, V., 21/06/2002, p. 23-29. 7 p.

    Research output: Contribution to conference - Without ISBN/ISSN Conference paperpeer-review

  85. Published

    Reconfigurable circuits for fault tolerant systems: factors to consider

    Richardson, A., Jeffrey, C. & Lechner, A., 21/06/2002, p. 215-218. 4 p.

    Research output: Contribution to conference - Without ISBN/ISSN Conference paperpeer-review

  86. Published

    Generation of component level fault models for MEMS

    Rosing, R., Reichenbach, R. & Richardson, A., 2002, In: Microelectronics Journal. 33, 10, p. 861-868 8 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  87. Published

    Generation of MEMS component models using Cosserat symbolic simulations

    Rosing, R., Wang, C., Tucker, R., Richardson, A. & De Masi, B., 2002, SPIE Proceedings: design, test, integration, and packaging of MEMS/MOEMS 2002. Vol. 4755. p. 149-154 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  88. Published

    Investigations for minimum invasion digital only built in ‘ramp’ based test techniques for charge pump PLLs.

    Burbidge, M. J., Tijou, J., Poullet, F. & Richardson, A. M. D., 2002, Proceedings of the Seventh IEEE European Test Workshop, 2002.. IEEE, p. 95-102 8 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  89. 2001
  90. Published

    3DB challenge for DfT, DfM, DOT and BIST integration into analogue and mixed signal ICs.

    Lechner, A., Burbidge, M. J., Richardson, A. M. D. & Hermes, B., 2001, Proceedings of the 2nd Latin-American test workshop (LATW ’01). p. 194-199 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  91. Published

    A failure mode analysis of a 6-bit folding ADCs.

    Lechner, A., Richardson, A. M. D., Burbidge, M. & Hermes, B., 2001, Proceedings of the 7th IEEE international mixed-signal testing workshop (IMSTW ’01). p. 19-23 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  92. Published

    Finite element analysis to support component level fault modelling for MEMS.

    Reichenbach, R., Rosing, R., Richardson, A. M. D. & Dorey, A. P., 2001, Proceedings of SPIE design, test, integration and packaging of MEMS symposium. Vol. 4408. p. 147-158 12 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  93. Published

    Generation of component level fault models for MEMS.

    Rosing, R., Reichenbach, R., Richardson, A. M. D. & Dorey, A. P., 2001, Proceedings of the 7th international mixed-signal testing workshop (IMSTW ’01). p. 40-45 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  94. Published

    Short circuit faults in state-of-the-art ADCs – are they hard or soft?

    Lechner, A., Richardson, A. M. D. & Hermes, B., 2001, 10th Asian Test Symposium : proceedings : 19-21 November, 2001, Kyoto, Japan. IEEE Computer Society, p. 417-422 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  95. Published

    Simple digital only test approach for embedded charge-pump phase-locked loops.

    Burbidge, M. & Richardson, A. M. D., 2001, In: Electronics Letters. 37, 22, p. 1318-1319 2 p.

    Research output: Contribution to Journal/MagazineJournal article

  96. Published

    Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions.

    Burbidge, M., Richardson, A. M. D. & Lechner, A., 2001, Proceedings of the 7th IEEE international test workshop. p. 97-102 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  97. Published

    Towards a better understanding of failure modes and test requirements of ADCs.

    Lechner, A., Richardson, A. M. D. & Hermes, B., 2001, Proceedings of a conference: automation and test in Europe (DATE ’01). p. 803

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  98. 2000
  99. Published

    A built-in test solution for a SMART silicon micromachined resonant pressure sensor.

    Jeffery, C., Rosing, R. & Richardson, A. M. D., 2000, IEEE European Test Workshop. IEEE

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  100. Published

    A fault simulation methodology for MEMS.

    Rosing, R., Richardson, A. M. D. & Dorey, A. P., 2000, Proceedings of the design automation and test in Europe conference. Paris: IEEE, p. 476-483 8 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  101. Published

    A fault simulation methodology for MEMS.

    Rosing, R., Richardson, A. M. D. & Dorey, A. P., 2000, Proceedings of the IEE symposium on quality and automation (RESQUA 2000). Penang, Malaysia

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  102. Published

    Applications of mixed signal test strategies to next generation microsystems.

    Jeffery, C., Rosing, R. & Richardson, A. M. D., 2000, Design, modeling, and simulation in microelectronics. 4228 ed. SPIE (Society of Photo-Optical Instrumentation Engineers), p. 21-32 12 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  103. Published

    Design-for-testability for mixed signal and analogue design.

    Richardson, A. M. D. & Lechner, A., 2000, Proceedings of 7th international conference on mixed design of integrated circuits and systems. Poland

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  104. Published

    Fault simulation and modelling of microelectromechanical systems.

    Rosing, R., Lechner, A., Richardson, A. M. D. & Dorey, A. P., 2000, In: IEE Journal on Computing and Control Engineering. 11, 5, p. 242-250 9 p.

    Research output: Contribution to Journal/MagazineJournal article

  105. 1999
  106. Published

    Reconfiguration based built-in self-test for analogue front-end circuits

    Richardson, A., Lechner, A. & Hermes, B., 18/06/1999, p. 243-247. 5 p.

    Research output: Contribution to conference - Without ISBN/ISSN Conference paperpeer-review

  107. Published

    Test support strategies for MEMS

    Richardson, A., Rosing, R., Peyton, A. & Dorey, A., 18/06/1999, p. 345-350. 6 p.

    Research output: Contribution to conference - Without ISBN/ISSN Conference paperpeer-review

  108. Published

    The application of neuMOS transistors to enhanced Built-in Self-Test (BIST) and product quality

    Richardson, A. & Nicholson, R., 18/06/1999, p. 257-261. 5 p.

    Research output: Contribution to conference - Without ISBN/ISSN Conference paperpeer-review

  109. Published

    Fault simulation for MEMS

    Rosing, R., Richardson, A., Dorey, A. & Peyton, A., 1/06/1999, Intelligent and Self-Validating Sensors (Ref. No. 1999/160), IEE Colloquium on. p. 7/1 -7/6

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  110. Published

    A digital partial built-in self-test structure for a high performance automatic gain control circuit

    Lechner, A., Ferguson, J., Richardson, A. & Hermes, B., 1999, DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION 1999, PROCEEDINGS. Borrione, D. & Ernst, R. (eds.). LOS ALAMITOS: IEEE COMPUTER SOC, p. 232-238 7 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  111. 1998
  112. Published

    An Integrated Diagnostic Reconfiguration (IDR) design approach for fault tolerant mixed signal integrated systems

    Richardson, A., Sharif, E. & Dorey, A., 11/06/1998, p. 88-90. 3 p.

    Research output: Contribution to conference - Without ISBN/ISSN Conference paper

  113. Published

    A design for testability study on a high performance automatic gain control circuit.

    Lechner, A., Richardson, A. M. D., Hermes, B. & Ohletz, M., 1998, Proceedings of the 16th IEEE VLSI test symposium. IEEE, p. 376-385 10 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  114. Published

    An approach to realistic fault prediction and layout design for testability in analog circuits

    Prieto, J. A., Rueda, A., Grout, I., Peralias, E., Huertas, J. L. & Richardson, A. M. D., 1998, Design, Automation and Test in Europe, 1998 Proceedings. LOS ALAMITOS: IEEE COMPUTER SOC, p. 905-909 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  115. Published

    An approach to realistic fault prediction and layout design for testability in analogue circuits.

    Prieto, J., Richardson, A. M. D., Rueda, A. & Grout, I., 1998, Proceedings of the conference on design, automation and test in Europe. Paris, p. 906-912 7 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  116. Published

    An integrated diagnostic reconfiguration (IDR) technique for fault tolerant mixed signal microsystems.

    Sharif, E., Dorey, A. P. & Richardson, A. M. D., 1998, Proceedings of the IEEE international circuits and systems symposium. IEEE

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  117. Published

    Clock switching: a new design for current test (DcT) method for dynamic logic circuits

    Rosing, R., Richardson, A. M. D., Kerkhoff, A. & Acosta, A., 1998, IDDQ Testing, 1998. Proceedings. 1998 IEEE International Workshop on. IEEE, p. 20-25 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  118. Published

    Design for testability strategies for a high performance gain control circuit.

    Lechner, A., Richardson, A. M. D., Hermes, B. & Perkins, A., 1998, Proceedings of the international IEEE mixed signal test workshop. The Hague

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

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