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Professor Andrew Richardson

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  1. 1992
  2. Published

    Reliability indicators.

    Richardson, A. M. D. & Dorey, A. P., 1992, Third European symposium of reliability of electron devices, failure, physics and analysis (ESREF). Schabisch Gmund, p. 277-285 9 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  3. Published

    Supply current monitoring in cmos circuits for reliability prediction and test.

    Richardson, A. M. D. & Dorey, A. P., 1992, In: Quality and Reliability Engineering International. 8, 6, p. 543-548 6 p.

    Research output: Contribution to Journal/Magazine › Journal article

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