• Published

  Reliable and Intelligent Fault Diagnosis with Evidential VGG Neural Networks

  Zhou, H., Chen, W., Cheng, L., Williams, D., De Silva, C. W. & Xia, M., 7/03/2023, In: IEEE Transactions on Instrumentation and Measurement. 72, p. 1-12 12 p., 3508612.

  Research output: Contribution to Journal/Magazine › Journal article › peer-review

• Published

  Digital Twin-Driven Machine Condition Monitoring: A Literature Review

  Liu, H., Xia, M., Williams, D., Sun, J., Yan, H. & Xiao, X., 30/07/2022, In: Journal of Sensors. 2022, 13 p., 6129995.

  Research output: Contribution to Journal/Magazine › Journal article › peer-review

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