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Professor Oleg Kolosov SFHEA

Professor of Nanoscience

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  1. Conference contribution/Paper
  2. Published

    Mapping nanomechanical phenomena in graphene nanostructures using force modulation and ultrasonic force microscopy

    Kolosov, O., Kay, N., Robinson, B., Rosamond, M. C., Zeze, D. A., Falko, V. & Dinelli, F., 2012, Nanotechnology 2012: Advanced Materials, CNTs, Particles, Films and Composites. Santa Clara, Calif.: CRC PRESS-TAYLOR & FRANCIS GROUP, Vol. 1. p. 282-285 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  3. Published

    Nanoscale SPM characterisation of nacre aragonite plates and synthetic human amyloid fibres

    Grishin, I., Tinker, C., Allsop, D., Robson, A. & Kolosov, O., 2012, NSTI-Nanotech 2012. Santa Clara, USA: CRC PRESS-TAYLOR & FRANCIS GROUP, Vol. 1. p. 110-113 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  4. Published

    Direct nanoscale imaging of ballistic and diffusive thermal transport in graphene nanostructures

    Kolosov, O., Pumarol Crestar, M., Tovee, P., Rosamond, M. C., Zeze, D. A. & Falko, V., 2012, NSTI-Nanotech 2012. Santa Clara, USA: CRC PRESS-TAYLOR & FRANCIS GROUP, Vol. 1. p. 206-209 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  5. Published

    Adhesion and dynamic nanotribology of graphene in polar and non-polar liquid environments studied with ultrasonic force microscopy

    Robinson, B., Kay, N. & Kolosov, O., 2012, NSTI-Nanotech 2012. Santa Clara, USA: CRC PRESS-TAYLOR & FRANCIS GROUP, Vol. 1. p. 150-153 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  6. Published

    Direct nanoscale 3D characterisation of Ge-Sb-Te and Ge-Te phase change films

    Grishin, I. & Kolosov, O., 2012, NSTI-Nanotech 2012. Santa Clara, USA: CRC PRESS-TAYLOR & FRANCIS GROUP, Vol. 1. p. 75-78 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  7. Published

    Transparent gold nanowire electrodes

    Rosamond, M. C., Gallant, A. J., Atherton, J. J., Petty, M. C., Kolosov, O. & Zeze, D. A., 2011, Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on . Portland, Ore.: IEEE, p. 604-607 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  8. Published

    High precision tuning fork sensor for liquid property measurements

    Matsiev, L., Bennett, J. & Kolosov, O., 1/12/2005, IEEE Ultrasonics Symposium, 2005.. IEEE, Vol. 3. 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  9. Published

    Multiparameteric oil condition sensor based on the tuning fork technology for automotive applications

    Buhrdorf, A., Dobrinski, H., Ludtke, O., Bennett, J., Matsiev, L., Uhrich, M. & Kolosov, O., 2005, Advanced Microsystems for Automotive Applications 2005. Valldorf, J. & Gessner, W. (eds.). Berlin: Springer Verlag, p. 289-298 10 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  10. Published

    Nanoscale elastic imaging and mechanical modulus measurements of aluminum/low-k dielectric interconnect structures

    Shekhawat, G. S., Briggs, G. A. D., Kolosov, O. & Geer, R. E., 2001, Characterization and metrology for ULSI Technology 2000, International Conference. Seiler, D. G., Diebold, A. C., Shaffner, T. J., McDonald, R., Bullis, W. M., Smith, P. J. & Secula, E. M. (eds.). Melville, New York: American Institute of Physics, p. 449-452 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  11. Published

    Characterisation of the nanometer-scale mechanical compliance of semiconductors by Ultrasonic Force Microscopy

    Huey, B. D., Langford, R. M., Briggs, G. A. D. & Kolosov, O., 2001, Microscopy of Semiconducting Materials 2001. Cullis, A. G. & Hutchison, J. L. (eds.). Bristol: IOP Publishing Ltd, p. 531-534 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

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