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Professor Oleg Kolosov SFHEA

Professor of Nanoscience

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  1. 2000
  2. Published

    Nanoscale elastic imaging of aluminum/low-k dielectric interconnect structures

    Shekhawat, G. S., Kolosov, O. V., Briggs, G. A. D., Shaffer, E. O., Martin, S. & Geer, R. E., 1/01/2000, In: Materials Research Society Symposium-Proceedings. 612, p. D171-D177 7 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  3. Published

    Nanoscale elastic imaging: a new metrology tool for low-k dielectric integration

    Shekhawat, G. S., Kolosov, O., Briggs, G. A. D., Shaffer, E. O., Martin, S. J. & Geer, R. E., 2000, Interconnect Technology Conference, 2000. Proceedings of the IEEE 2000 International . New York: IEEE, p. 96-98 3 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  4. 1999
  5. Published

    A microstructural study of transparent metal oxide gas barrier films

    Henry, B. M., Dinelli, F., Zhao, K. Y., Grovenor, C. R. M., Kolosov, O., Briggs, G. A. D., Roberts, A. P., Kumar, R. S. & Howson, R. P., 1/11/1999, In: Thin Solid Films. 355-356, p. 500-505 6 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  6. Published

    Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)

    Dinelli, F., Assender, H. E., Takeda, N., Briggs, G. A. D. & Kolosov, O. V., 05/1999, In: Surface and Interface Analysis. 27, 5-6, p. 562-567 6 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  7. Published

    Early stages of growth and nanostructure of Pb(Zr,Ti)O-3 thin films observed by atomic force microscopy

    Craciun, F., Verardi, P., Dinescu, M., Dinelli, F. & Kolosov, O., 1999, Thin films epitaxial growth and nanostructures : proceedings of the EMRS Spring Conference, Strasbourg, France, June 16-19, 1998 / . Kasper, E., Wang, K. L. & Hasegawa, H. (eds.). Amsterdam: Elsevier, p. 281-285 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  8. 1998
  9. Published

    Early stages of growth and nanostructure of Pb(Zr,Ti)O-3 thin films observed by atomic force microscopy

    Craciun, F., Verardi, P., Dinescu, M., Dinelli, F. & Kolosov, O., 30/12/1998, In: Thin Solid Films. 336, 1-2, p. 281-285 5 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  10. Published

    UFM shakes out the details at the nanoscopic scale

    Kolosov, O., 12/1998, In: Materials World. 6, 12, p. 753-754 2 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  11. Published

    Imaging the elastic nanostructure of Ge islands by ultrasonic force microscopy

    Kolosov, O., Castell, M. R., Marsh, C. D., Briggs, G. A. D., Kamins, T. I. & Williams, R. S., 3/08/1998, In: Physical review letters. 81, 5, p. 1046-1049 4 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  12. Published

    Atomic force microscopy apparatus and a method thereof

    Kolosov, O. (Inventor) & Briggs, G. A. D. (Inventor), 26/02/1998, IPC No. G01 B 7/34, Patent No. WO 98/08046

    Research output: Patent

  13. Published

    Anisotropic elastic characterization of surfaces from 2 MHz to 20 GHz

    Briggs, A. & Kolosov, O., 02/1998, In: Ultrasonics. 36, 1-5, p. 317-321 5 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

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