Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
| Publication date | 1999 |
|---|---|
| Host publication | DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION 1999, PROCEEDINGS |
| Editors | D Borrione, R Ernst |
| Place of Publication | LOS ALAMITOS |
| Publisher | IEEE COMPUTER SOC |
| Pages | 232-238 |
| Number of pages | 7 |
| ISBN (Print) | 0-7695-0078-1 |
| <mark>Original language</mark> | English |
It is now widely recognised that Design-for-Testability and Built-in Self-Test techniques rc ill be mandatory to meet test and quality specifications in next generation mired signal integrated systems. This paper describes a new digital on-chip post processing function capable of reducing production test time for a high performance automatic gain control circuit by 70%.