Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Publication date | 1999 |
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Host publication | DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION 1999, PROCEEDINGS |
Editors | D Borrione, R Ernst |
Place of Publication | LOS ALAMITOS |
Publisher | IEEE COMPUTER SOC |
Pages | 232-238 |
Number of pages | 7 |
ISBN (print) | 0-7695-0078-1 |
<mark>Original language</mark> | English |
It is now widely recognised that Design-for-Testability and Built-in Self-Test techniques rc ill be mandatory to meet test and quality specifications in next generation mired signal integrated systems. This paper describes a new digital on-chip post processing function capable of reducing production test time for a high performance automatic gain control circuit by 70%.