A high-resolution multiple analysis approach using near-field thermal probes.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Published

Standard

A high-resolution multiple analysis approach using near-field thermal probes. / Hammiche, A.; Reading, M.; Grandy, D. et al.
Proceedings of the 12th International Conference: Scanning Tunneling Microscopy/Spectroscopy and Related Techniques. ed. / P.M. Koenraad; M. Kemerink. Melville, USA: American Institute of Physics, 2003. p. 369-376.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Harvard

Hammiche, A, Reading, M, Grandy, D, Price, DM, German, MJ, Bozec, L, Weaver, JMR, Stopford, P, Mills, G & Pollock, HM 2003, A high-resolution multiple analysis approach using near-field thermal probes. in PM Koenraad & M Kemerink (eds), Proceedings of the 12th International Conference: Scanning Tunneling Microscopy/Spectroscopy and Related Techniques. American Institute of Physics, Melville, USA, pp. 369-376.

APA

Hammiche, A., Reading, M., Grandy, D., Price, D. M., German, M. J., Bozec, L., Weaver, J. M. R., Stopford, P., Mills, G., & Pollock, H. M. (2003). A high-resolution multiple analysis approach using near-field thermal probes. In P. M. Koenraad, & M. Kemerink (Eds.), Proceedings of the 12th International Conference: Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (pp. 369-376). American Institute of Physics.

Vancouver

Hammiche A, Reading M, Grandy D, Price DM, German MJ, Bozec L et al. A high-resolution multiple analysis approach using near-field thermal probes. In Koenraad PM, Kemerink M, editors, Proceedings of the 12th International Conference: Scanning Tunneling Microscopy/Spectroscopy and Related Techniques. Melville, USA: American Institute of Physics. 2003. p. 369-376

Author

Hammiche, A. ; Reading, M. ; Grandy, D. et al. / A high-resolution multiple analysis approach using near-field thermal probes. Proceedings of the 12th International Conference: Scanning Tunneling Microscopy/Spectroscopy and Related Techniques. editor / P.M. Koenraad ; M. Kemerink. Melville, USA : American Institute of Physics, 2003. pp. 369-376

Bibtex

@inbook{297974d7d97f4d1497a996182b7ce7be,

title = "A high-resolution multiple analysis approach using near-field thermal probes.",

author = "A. Hammiche and M. Reading and D. Grandy and Price, {D. M.} and German, {M. J.} and L. Bozec and Weaver, {J. M. R.} and P. Stopford and G. Mills and Pollock, {H. M.}",

year = "2003",

month = dec,

day = "19",

language = "English",

isbn = "0735401683",

pages = "369--376",

editor = "P.M. Koenraad and M. Kemerink",

booktitle = "Proceedings of the 12th International Conference: Scanning Tunneling Microscopy/Spectroscopy and Related Techniques",

publisher = "American Institute of Physics",

}

RIS

TY - CHAP

T1 - A high-resolution multiple analysis approach using near-field thermal probes.

AU - Hammiche, A.

AU - Reading, M.

AU - Grandy, D.

AU - Price, D. M.

AU - German, M. J.

AU - Bozec, L.

AU - Weaver, J. M. R.

AU - Stopford, P.

AU - Mills, G.

AU - Pollock, H. M.

PY - 2003/12/19

Y1 - 2003/12/19

M3 - Chapter

SN - 0735401683

SP - 369

EP - 376

BT - Proceedings of the 12th International Conference: Scanning Tunneling Microscopy/Spectroscopy and Related Techniques

A2 - Koenraad, P.M.

A2 - Kemerink, M.

PB - American Institute of Physics

CY - Melville, USA

ER -

Research