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  • A_Novel_Multiview_Sampling-based_Meta_Self-Paced_Learning_Approach_for_Class-imbalanced_Intelligent_Fault_Diagnosis

    Rights statement: ©2022 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

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A Novel Multiview Sampling-based Meta Self-Paced Learning Approach for Class-imbalanced Intelligent Fault Diagnosis

Research output: Contribution to Journal/Magazine › Journal article › peer-review

E-pub ahead of print

Standard

A Novel Multiview Sampling-based Meta Self-Paced Learning Approach for Class-imbalanced Intelligent Fault Diagnosis. / Lyu, Pin; Zheng, Pai; Yu, Wenbing et al.
In: IEEE Transactions on Instrumentation and Measurement, 13.10.2022, p. 1-1.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Lyu, P, Zheng, P, Yu, W, Liu, C & Xia, M 2022, 'A Novel Multiview Sampling-based Meta Self-Paced Learning Approach for Class-imbalanced Intelligent Fault Diagnosis', IEEE Transactions on Instrumentation and Measurement, pp. 1-1. https://doi.org/10.1109/tim.2022.3214628

APA

Lyu, P., Zheng, P., Yu, W., Liu, C., & Xia, M. (2022). A Novel Multiview Sampling-based Meta Self-Paced Learning Approach for Class-imbalanced Intelligent Fault Diagnosis. IEEE Transactions on Instrumentation and Measurement, 1-1. Advance online publication. https://doi.org/10.1109/tim.2022.3214628

Vancouver

Lyu P, Zheng P, Yu W, Liu C, Xia M. A Novel Multiview Sampling-based Meta Self-Paced Learning Approach for Class-imbalanced Intelligent Fault Diagnosis. IEEE Transactions on Instrumentation and Measurement. 2022 Oct 13;1-1. Epub 2022 Oct 13. doi: 10.1109/tim.2022.3214628

Author

Lyu, Pin ; Zheng, Pai ; Yu, Wenbing et al. / A Novel Multiview Sampling-based Meta Self-Paced Learning Approach for Class-imbalanced Intelligent Fault Diagnosis. In: IEEE Transactions on Instrumentation and Measurement. 2022 ; pp. 1-1.

Bibtex

@article{c3e58e387b314ab884b7845a353934e6,
title = "A Novel Multiview Sampling-based Meta Self-Paced Learning Approach for Class-imbalanced Intelligent Fault Diagnosis",
keywords = "Electrical and Electronic Engineering, Instrumentation",
author = "Pin Lyu and Pai Zheng and Wenbing Yu and Chao Liu and Min Xia",
note = "{\textcopyright}2022 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. ",
year = "2022",
month = oct,
day = "13",
doi = "10.1109/tim.2022.3214628",
language = "English",
pages = "1--1",
journal = "IEEE Transactions on Instrumentation and Measurement",
issn = "0018-9456",
publisher = "IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC",

}

RIS

TY - JOUR

T1 - A Novel Multiview Sampling-based Meta Self-Paced Learning Approach for Class-imbalanced Intelligent Fault Diagnosis

AU - Lyu, Pin

AU - Zheng, Pai

AU - Yu, Wenbing

AU - Liu, Chao

AU - Xia, Min

N1 - ©2022 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

PY - 2022/10/13

Y1 - 2022/10/13

KW - Electrical and Electronic Engineering

KW - Instrumentation

U2 - 10.1109/tim.2022.3214628

DO - 10.1109/tim.2022.3214628

M3 - Journal article

SP - 1

EP - 1

JO - IEEE Transactions on Instrumentation and Measurement

JF - IEEE Transactions on Instrumentation and Measurement

SN - 0018-9456

ER -