Research output: Contribution to Journal/Magazine › Journal article › peer-review
Research output: Contribution to Journal/Magazine › Journal article › peer-review
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TY - JOUR
T1 - A test of stationarity for textured images
AU - Taylor, Sarah
AU - Eckley, Idris
AU - Nunes, Matthew
PY - 2014
Y1 - 2014
N2 - This article proposes a test of stationarity for random fields on a regular lattice motivated by a problem arising from texture analysis. Our approach is founded on the locally stationary two-dimensional wavelet (LS2W) process model for lattice processes which has previously been used for standard texture analysis tasks such as texture discrimination and classification. We propose two variants of our stationarity test, both of which can be performed on a single realisation – a feature of particular practical importance within texture analysis. We illustrate our approach with pilled fabric data, demonstrating that the test is capable of identifying visually-subtle changes in stationarity. Supplementary material for this article is available online.
AB - This article proposes a test of stationarity for random fields on a regular lattice motivated by a problem arising from texture analysis. Our approach is founded on the locally stationary two-dimensional wavelet (LS2W) process model for lattice processes which has previously been used for standard texture analysis tasks such as texture discrimination and classification. We propose two variants of our stationarity test, both of which can be performed on a single realisation – a feature of particular practical importance within texture analysis. We illustrate our approach with pilled fabric data, demonstrating that the test is capable of identifying visually-subtle changes in stationarity. Supplementary material for this article is available online.
KW - bootstrapping
KW - fabric analysis
KW - lattice processes
KW - non-stationarity
KW - random field
U2 - 10.1080/00401706.2013.823890
DO - 10.1080/00401706.2013.823890
M3 - Journal article
VL - 56
SP - 291
EP - 301
JO - Technometrics
JF - Technometrics
SN - 0040-1706
IS - 3
ER -