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Accurate analysis of plasmonic devices with a new Drude Critical Points MRTD method

Research output: Contribution to Journal/MagazineLetterpeer-review

<mark>Journal publication date</mark>2012
<mark>Journal</mark>IEEE Photonics Technology Letters
Issue number18
Number of pages4
Pages (from-to)1587-1590
Publication StatusPublished
<mark>Original language</mark>English


A new Drude two critical points (D-2CP) multiresolution time domain numerical method for the simulation of surface plasmon polariton in metallic inclusions is presented. A D-2CP model is used to accurately describe the dielectric function of the metallic inclusions, and it is compared with other Drude models reported in the literature. The superior accuracy given by the D-2CP model avoids the formation of spurious reflections at the boundary interface between metal and dielectric, which can greatly affect the accuracy of the numerical results.