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Accurate analysis of plasmonic devices with a new Drude Critical Points MRTD method

Research output: Contribution to Journal/Magazine › Letter › peer-review

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Accurate analysis of plasmonic devices with a new Drude Critical Points MRTD method. / Letizia, Rosa; Pinto, Domenico.
In: IEEE Photonics Technology Letters, Vol. 24, No. 18, 2012, p. 1587-1590.

Research output: Contribution to Journal/Magazine › Letter › peer-review

Harvard

Letizia, R & Pinto, D 2012, 'Accurate analysis of plasmonic devices with a new Drude Critical Points MRTD method', IEEE Photonics Technology Letters, vol. 24, no. 18, pp. 1587-1590. https://doi.org/10.1109/LPT.2012.2209634

APA

Letizia, R., & Pinto, D. (2012). Accurate analysis of plasmonic devices with a new Drude Critical Points MRTD method. IEEE Photonics Technology Letters, 24(18), 1587-1590. https://doi.org/10.1109/LPT.2012.2209634

Vancouver

Letizia R, Pinto D. Accurate analysis of plasmonic devices with a new Drude Critical Points MRTD method. IEEE Photonics Technology Letters. 2012;24(18):1587-1590. doi: 10.1109/LPT.2012.2209634

Author

Letizia, Rosa ; Pinto, Domenico. / Accurate analysis of plasmonic devices with a new Drude Critical Points MRTD method. In: IEEE Photonics Technology Letters. 2012 ; Vol. 24, No. 18. pp. 1587-1590.

Bibtex

@article{fee8a564be7c4303bf9bcc32c76dd383,
title = "Accurate analysis of plasmonic devices with a new Drude Critical Points MRTD method",
abstract = "A new Drude two critical points (D-2CP) multiresolution time domain numerical method for the simulation of surface plasmon polariton in metallic inclusions is presented. A D-2CP model is used to accurately describe the dielectric function of the metallic inclusions, and it is compared with other Drude models reported in the literature. The superior accuracy given by the D-2CP model avoids the formation of spurious reflections at the boundary interface between metal and dielectric, which can greatly affect the accuracy of the numerical results.",
keywords = "Accuracy, Computational modeling, Numerical models, Plasmons , Silver, Time domain analysis ",
author = "Rosa Letizia and Domenico Pinto",
year = "2012",
doi = "10.1109/LPT.2012.2209634",
language = "English",
volume = "24",
pages = "1587--1590",
journal = "IEEE Photonics Technology Letters",
issn = "1041-1135",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "18",

}

RIS

TY - JOUR

T1 - Accurate analysis of plasmonic devices with a new Drude Critical Points MRTD method

AU - Letizia, Rosa

AU - Pinto, Domenico

PY - 2012

Y1 - 2012

N2 - A new Drude two critical points (D-2CP) multiresolution time domain numerical method for the simulation of surface plasmon polariton in metallic inclusions is presented. A D-2CP model is used to accurately describe the dielectric function of the metallic inclusions, and it is compared with other Drude models reported in the literature. The superior accuracy given by the D-2CP model avoids the formation of spurious reflections at the boundary interface between metal and dielectric, which can greatly affect the accuracy of the numerical results.

AB - A new Drude two critical points (D-2CP) multiresolution time domain numerical method for the simulation of surface plasmon polariton in metallic inclusions is presented. A D-2CP model is used to accurately describe the dielectric function of the metallic inclusions, and it is compared with other Drude models reported in the literature. The superior accuracy given by the D-2CP model avoids the formation of spurious reflections at the boundary interface between metal and dielectric, which can greatly affect the accuracy of the numerical results.

KW - Accuracy

KW - Computational modeling

KW - Numerical models

KW - Plasmons

KW - Silver

KW - Time domain analysis

U2 - 10.1109/LPT.2012.2209634

DO - 10.1109/LPT.2012.2209634

M3 - Letter

VL - 24

SP - 1587

EP - 1590

JO - IEEE Photonics Technology Letters

JF - IEEE Photonics Technology Letters

SN - 1041-1135

IS - 18

ER -