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Adjustable Acoustic Knife Edge for Anisotropic and Dark-Field Acoustic Imaging

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Adjustable Acoustic Knife Edge for Anisotropic and Dark-Field Acoustic Imaging. / Kolosov, Oleg; Yamanaka, Kazushi.
In: Japanese Journal of Applied Physics, Vol. 33, No. 1A, 01.1994, p. 329-333.

Research output: Contribution to Journal/MagazineJournal articlepeer-review

Harvard

Kolosov, O & Yamanaka, K 1994, 'Adjustable Acoustic Knife Edge for Anisotropic and Dark-Field Acoustic Imaging', Japanese Journal of Applied Physics, vol. 33, no. 1A, pp. 329-333. https://doi.org/10.1143/JJAP.33.329

APA

Vancouver

Kolosov O, Yamanaka K. Adjustable Acoustic Knife Edge for Anisotropic and Dark-Field Acoustic Imaging. Japanese Journal of Applied Physics. 1994 Jan;33(1A):329-333. doi: 10.1143/JJAP.33.329

Author

Kolosov, Oleg ; Yamanaka, Kazushi. / Adjustable Acoustic Knife Edge for Anisotropic and Dark-Field Acoustic Imaging. In: Japanese Journal of Applied Physics. 1994 ; Vol. 33, No. 1A. pp. 329-333.

Bibtex

@article{5a4fe0d5c1d148428c939f3e5323ad35,
title = "Adjustable Acoustic Knife Edge for Anisotropic and Dark-Field Acoustic Imaging",
abstract = "A new effective method for acoustic anisotropy and dark-held imaging in reflection ultrasonic focusing devices is proposed. Part of the spherical acoustic wave propagating to and coming from the object is stopped by an ultrasonically opaque acoustic knife edge (AKE) set at the aperture plane of the focusing lens or transducer. This AKE provides the focusing device with directional sensitivity and the capacity for dark-field imaging. Sensitivity of the AKE system to the elastic anisotropy of the leaky surface acoustic wave (LSAW) velocity was demonstrated using an X-cut LiNbO3 crystal. Dark-field imaging of cracks in Si3N4 ceramics and the structure of carbon fiber-reinforced plastic (FRP) was performed. This method can be easily applied to commercially available focusing systems and allows optimization of the setup for the microscopic study of various objects.",
author = "Oleg Kolosov and Kazushi Yamanaka",
year = "1994",
month = jan,
doi = "10.1143/JJAP.33.329",
language = "English",
volume = "33",
pages = "329--333",
journal = "Japanese Journal of Applied Physics",
issn = "0021-4922",
publisher = "Institute of Physics Publishing",
number = "1A",

}

RIS

TY - JOUR

T1 - Adjustable Acoustic Knife Edge for Anisotropic and Dark-Field Acoustic Imaging

AU - Kolosov, Oleg

AU - Yamanaka, Kazushi

PY - 1994/1

Y1 - 1994/1

N2 - A new effective method for acoustic anisotropy and dark-held imaging in reflection ultrasonic focusing devices is proposed. Part of the spherical acoustic wave propagating to and coming from the object is stopped by an ultrasonically opaque acoustic knife edge (AKE) set at the aperture plane of the focusing lens or transducer. This AKE provides the focusing device with directional sensitivity and the capacity for dark-field imaging. Sensitivity of the AKE system to the elastic anisotropy of the leaky surface acoustic wave (LSAW) velocity was demonstrated using an X-cut LiNbO3 crystal. Dark-field imaging of cracks in Si3N4 ceramics and the structure of carbon fiber-reinforced plastic (FRP) was performed. This method can be easily applied to commercially available focusing systems and allows optimization of the setup for the microscopic study of various objects.

AB - A new effective method for acoustic anisotropy and dark-held imaging in reflection ultrasonic focusing devices is proposed. Part of the spherical acoustic wave propagating to and coming from the object is stopped by an ultrasonically opaque acoustic knife edge (AKE) set at the aperture plane of the focusing lens or transducer. This AKE provides the focusing device with directional sensitivity and the capacity for dark-field imaging. Sensitivity of the AKE system to the elastic anisotropy of the leaky surface acoustic wave (LSAW) velocity was demonstrated using an X-cut LiNbO3 crystal. Dark-field imaging of cracks in Si3N4 ceramics and the structure of carbon fiber-reinforced plastic (FRP) was performed. This method can be easily applied to commercially available focusing systems and allows optimization of the setup for the microscopic study of various objects.

U2 - 10.1143/JJAP.33.329

DO - 10.1143/JJAP.33.329

M3 - Journal article

VL - 33

SP - 329

EP - 333

JO - Japanese Journal of Applied Physics

JF - Japanese Journal of Applied Physics

SN - 0021-4922

IS - 1A

ER -