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Alpha contamination assay, dosimetry and spectrometry using charge coupled devices. /
Newton, Rosie; Dykes, Joseph; Scott, Mike J. et al.
2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016. Institute of Electrical and Electronics Engineers Inc., 2017. 8069815 (2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016; Vol. 2017-January).
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Harvard
Newton, R, Dykes, J, Scott, MJ
& Joyce, MJ 2017,
Alpha contamination assay, dosimetry and spectrometry using charge coupled devices. in
2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016., 8069815, 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016, vol. 2017-January, Institute of Electrical and Electronics Engineers Inc., 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016, Strasbourg, France,
29/10/16.
https://doi.org/10.1109/NSSMIC.2016.8069815
APA
Newton, R., Dykes, J., Scott, M. J.
, & Joyce, M. J. (2017).
Alpha contamination assay, dosimetry and spectrometry using charge coupled devices. In
2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016 Article 8069815 (2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016; Vol. 2017-January). Institute of Electrical and Electronics Engineers Inc..
https://doi.org/10.1109/NSSMIC.2016.8069815
Vancouver
Author
Bibtex
@inproceedings{fac63b4c03c342539ccb08b06241a623,
title = "Alpha contamination assay, dosimetry and spectrometry using charge coupled devices",
abstract = "The potential of using charge coupled devices (CCDs) to perform in-situ spectroscopy of alpha contamination has been investigated. The literature describing previous research shows that alpha particles give a distinctive readout from CCDs when compared with other types of radiation. TRIM (Transport of Ions in Matter) simulations have been performed to identify optimum features of CCDs for detecting alpha particles. It has been shown that thinner gate structures (i.e. less than 2 μm thickness) are preferable for low-energy alpha particles. For high-energy particles a sensitive region of at least 56 μm is required for maximum charge collection. More than 90% of the ionization has been shown to occur in the sensitive region for a wide range of alpha particle energies using typical CCD specifications and 78% useful ionization occurred for a thick structure at an energy of 2.232 MeV. An experimental investigation into the response of CCDs to alpha particles is described focused on the relationship between the size of the pixel clusters, the corresponding extent of blooming and the incident alpha particle energy.",
author = "Rosie Newton and Joseph Dykes and Scott, {Mike J.} and Joyce, {Malcolm J.}",
note = "Copyright: Copyright 2020 Elsevier B.V., All rights reserved.; 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016 ; Conference date: 29-10-2016 Through 06-11-2016",
year = "2017",
month = oct,
day = "16",
doi = "10.1109/NSSMIC.2016.8069815",
language = "English",
series = "2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016",
}
RIS
TY - GEN
T1 - Alpha contamination assay, dosimetry and spectrometry using charge coupled devices
AU - Newton, Rosie
AU - Dykes, Joseph
AU - Scott, Mike J.
AU - Joyce, Malcolm J.
N1 - Copyright:
Copyright 2020 Elsevier B.V., All rights reserved.
PY - 2017/10/16
Y1 - 2017/10/16
N2 - The potential of using charge coupled devices (CCDs) to perform in-situ spectroscopy of alpha contamination has been investigated. The literature describing previous research shows that alpha particles give a distinctive readout from CCDs when compared with other types of radiation. TRIM (Transport of Ions in Matter) simulations have been performed to identify optimum features of CCDs for detecting alpha particles. It has been shown that thinner gate structures (i.e. less than 2 μm thickness) are preferable for low-energy alpha particles. For high-energy particles a sensitive region of at least 56 μm is required for maximum charge collection. More than 90% of the ionization has been shown to occur in the sensitive region for a wide range of alpha particle energies using typical CCD specifications and 78% useful ionization occurred for a thick structure at an energy of 2.232 MeV. An experimental investigation into the response of CCDs to alpha particles is described focused on the relationship between the size of the pixel clusters, the corresponding extent of blooming and the incident alpha particle energy.
AB - The potential of using charge coupled devices (CCDs) to perform in-situ spectroscopy of alpha contamination has been investigated. The literature describing previous research shows that alpha particles give a distinctive readout from CCDs when compared with other types of radiation. TRIM (Transport of Ions in Matter) simulations have been performed to identify optimum features of CCDs for detecting alpha particles. It has been shown that thinner gate structures (i.e. less than 2 μm thickness) are preferable for low-energy alpha particles. For high-energy particles a sensitive region of at least 56 μm is required for maximum charge collection. More than 90% of the ionization has been shown to occur in the sensitive region for a wide range of alpha particle energies using typical CCD specifications and 78% useful ionization occurred for a thick structure at an energy of 2.232 MeV. An experimental investigation into the response of CCDs to alpha particles is described focused on the relationship between the size of the pixel clusters, the corresponding extent of blooming and the incident alpha particle energy.
UR - http://www.scopus.com/inward/record.url?scp=85041745563&partnerID=8YFLogxK
U2 - 10.1109/NSSMIC.2016.8069815
DO - 10.1109/NSSMIC.2016.8069815
M3 - Conference contribution/Paper
AN - SCOPUS:85041745563
T3 - 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
BT - 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
Y2 - 29 October 2016 through 6 November 2016
ER -
