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An Integrated Diagnostic Reconfiguration (IDR) design approach for fault tolerant mixed signal integrated systems

Research output: Contribution to conference - Without ISBN/ISSN Conference paper

Publication date11/06/1998
Number of pages3
<mark>Original language</mark>English
Event4th IEEE International Mixed-Signal Testing Workshop - The Hague, Netherlands
Duration: 8/06/199811/06/1998


Conference4th IEEE International Mixed-Signal Testing Workshop
CityThe Hague


An Integrated Diagnostic Reconfiguration (IDR) approach is presented that is compatible with a range of mixed signal circuits and sensors used in high dependability systems. The technique achieves improved testability, diagnostic capabilities and fault tolerance through reconfiguration.

The approach has been used to implement a prototype fault-tolerant interface ASIC for a piezoresistive silicon pressure sensor. This paper will describe the technique, an application and present results from measurements on the silicon implementation.