An Integrated Diagnostic Reconfiguration (IDR) approach is presented that is compatible with a range of mixed signal circuits and sensors used in high dependability systems. The technique achieves improved testability, diagnostic capabilities and fault tolerance through reconfiguration.

The approach has been used to implement a prototype fault-tolerant interface ASIC for a piezoresistive silicon pressure sensor. This paper will describe the technique, an application and present results from measurements on the silicon implementation.