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An Integrated Diagnostic Reconfiguration (IDR) design approach for fault tolerant mixed signal integrated systems

Research output: Contribution to conference - Without ISBN/ISSN › Conference paper

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An Integrated Diagnostic Reconfiguration (IDR) design approach for fault tolerant mixed signal integrated systems. / Richardson, Andrew; Sharif, Erfaan; Dorey, Anthony.
1998. 88-90 Paper presented at 4th IEEE International Mixed-Signal Testing Workshop, The Hague, Netherlands.

Research output: Contribution to conference - Without ISBN/ISSN › Conference paper

Harvard

Richardson, A, Sharif, E & Dorey, A 1998, 'An Integrated Diagnostic Reconfiguration (IDR) design approach for fault tolerant mixed signal integrated systems', Paper presented at 4th IEEE International Mixed-Signal Testing Workshop, The Hague, Netherlands, 8/06/98 - 11/06/98 pp. 88-90.

APA

Richardson, A., Sharif, E., & Dorey, A. (1998). An Integrated Diagnostic Reconfiguration (IDR) design approach for fault tolerant mixed signal integrated systems. 88-90. Paper presented at 4th IEEE International Mixed-Signal Testing Workshop, The Hague, Netherlands.

Vancouver

Richardson A, Sharif E, Dorey A. An Integrated Diagnostic Reconfiguration (IDR) design approach for fault tolerant mixed signal integrated systems. 1998. Paper presented at 4th IEEE International Mixed-Signal Testing Workshop, The Hague, Netherlands.

Author

Richardson, Andrew ; Sharif, Erfaan ; Dorey, Anthony. / An Integrated Diagnostic Reconfiguration (IDR) design approach for fault tolerant mixed signal integrated systems. Paper presented at 4th IEEE International Mixed-Signal Testing Workshop, The Hague, Netherlands.3 p.

Bibtex

@conference{007ede6216bf42fe97b8d14cd6f87be7,
title = "An Integrated Diagnostic Reconfiguration (IDR) design approach for fault tolerant mixed signal integrated systems",
abstract = "An Integrated Diagnostic Reconfiguration (IDR) approach is presented that is compatible with a range of mixed signal circuits and sensors used in high dependability systems. The technique achieves improved testability, diagnostic capabilities and fault tolerance through reconfiguration.The approach has been used to implement a prototype fault-tolerant interface ASIC for a piezoresistive silicon pressure sensor. This paper will describe the technique, an application and present results from measurements on the silicon implementation.",
keywords = "sensor test, fault tolerance",
author = "Andrew Richardson and Erfaan Sharif and Anthony Dorey",
year = "1998",
month = jun,
day = "11",
language = "English",
pages = "88--90",
note = "4th IEEE International Mixed-Signal Testing Workshop ; Conference date: 08-06-1998 Through 11-06-1998",

}

RIS

TY - CONF

T1 - An Integrated Diagnostic Reconfiguration (IDR) design approach for fault tolerant mixed signal integrated systems

AU - Richardson, Andrew

AU - Sharif, Erfaan

AU - Dorey, Anthony

PY - 1998/6/11

Y1 - 1998/6/11

N2 - An Integrated Diagnostic Reconfiguration (IDR) approach is presented that is compatible with a range of mixed signal circuits and sensors used in high dependability systems. The technique achieves improved testability, diagnostic capabilities and fault tolerance through reconfiguration.The approach has been used to implement a prototype fault-tolerant interface ASIC for a piezoresistive silicon pressure sensor. This paper will describe the technique, an application and present results from measurements on the silicon implementation.

AB - An Integrated Diagnostic Reconfiguration (IDR) approach is presented that is compatible with a range of mixed signal circuits and sensors used in high dependability systems. The technique achieves improved testability, diagnostic capabilities and fault tolerance through reconfiguration.The approach has been used to implement a prototype fault-tolerant interface ASIC for a piezoresistive silicon pressure sensor. This paper will describe the technique, an application and present results from measurements on the silicon implementation.

KW - sensor test

KW - fault tolerance

M3 - Conference paper

SP - 88

EP - 90

T2 - 4th IEEE International Mixed-Signal Testing Workshop

Y2 - 8 June 1998 through 11 June 1998

ER -