Home > Research > Publications & Outputs > Analyzing GEM-foil properties with an optical s...

Associated organisational unit

View graph of relations

Analyzing GEM-foil properties with an optical scanning system

Research output: Contribution to Journal/MagazineJournal articlepeer-review

  • M. Kalliokoski
  • T. Hilden
  • F. Garcia
  • J. Heino
  • R. Lauhakangas
  • E. Tuominen
  • R. Turpeinen
Article numberC02059
<mark>Journal publication date</mark>02/2012
<mark>Journal</mark>Journal of Instrumentation
Number of pages10
Pages (from-to)-
Publication StatusPublished
<mark>Original language</mark>English


An optical scanning system was commissioned and further developed in the Detector Laboratory of Helsinki Institute of Physics and University of Helsinki. It was designed to automatically scan, perform on-line analysis and to classify the overall quality of GEM-foils especially of the GEM-TPC detectors for Super-FRS at FAIR. The optical scanning system consists of precision positioning table, lighting, optics and operating system with analysis software. It has active scanning area of 95 cm x 95 cm and it can study this area with a resolution of 144 lp/mm. In this paper the performance of the system is studied on different measurement tasks.