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Aspects of current reference generation and distribution for IDDx pass/fail current determination.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Published
Publication date1993
Host publicationProceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240
Place of PublicationLondon
Number of pages0
<mark>Original language</mark>English