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Aspects of current reference generation and distribution for IDDx pass/fail current determination.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

Published

Standard

Aspects of current reference generation and distribution for IDDx pass/fail current determination. / Bratt, Adrian; Harvey, R. J. A.; Dorey, A. P. et al.
Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. London, 1993.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

Harvard

Bratt, A, Harvey, RJA, Dorey, AP & Richardson, AMD 1993, Aspects of current reference generation and distribution for IDDx pass/fail current determination. in Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. London.

APA

Bratt, A., Harvey, R. J. A., Dorey, A. P., & Richardson, A. M. D. (1993). Aspects of current reference generation and distribution for IDDx pass/fail current determination. In Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240

Vancouver

Bratt A, Harvey RJA, Dorey AP, Richardson AMD. Aspects of current reference generation and distribution for IDDx pass/fail current determination. In Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. London. 1993

Author

Bratt, Adrian ; Harvey, R. J. A. ; Dorey, A. P. et al. / Aspects of current reference generation and distribution for IDDx pass/fail current determination. Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. London, 1993.

Bibtex

@inbook{555649e6817547c58c593be841c2469e,
title = "Aspects of current reference generation and distribution for IDDx pass/fail current determination.",
author = "Adrian Bratt and Harvey, {R. J. A.} and Dorey, {A. P.} and Richardson, {A. M. D.}",
year = "1993",
language = "English",
booktitle = "Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240",

}

RIS

TY - CHAP

T1 - Aspects of current reference generation and distribution for IDDx pass/fail current determination.

AU - Bratt, Adrian

AU - Harvey, R. J. A.

AU - Dorey, A. P.

AU - Richardson, A. M. D.

PY - 1993

Y1 - 1993

M3 - Chapter

BT - Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240

CY - London

ER -