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Characterization of surface damage via contact probes

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Characterization of surface damage via contact probes. / Warren, P. D.; Kolosov, Oleg; Roberts, S. G. et al.
In: Nanotechnology, Vol. 7, No. 3, 09.1996, p. 288-294.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Warren, PD, Kolosov, O, Roberts, SG & Briggs, GAD 1996, 'Characterization of surface damage via contact probes', Nanotechnology, vol. 7, no. 3, pp. 288-294. https://doi.org/10.1088/0957-4484/7/3/019

APA

Warren, P. D., Kolosov, O., Roberts, S. G., & Briggs, G. A. D. (1996). Characterization of surface damage via contact probes. Nanotechnology, 7(3), 288-294. https://doi.org/10.1088/0957-4484/7/3/019

Vancouver

Warren PD, Kolosov O, Roberts SG, Briggs GAD. Characterization of surface damage via contact probes. Nanotechnology. 1996 Sept;7(3):288-294. doi: 10.1088/0957-4484/7/3/019

Author

Warren, P. D. ; Kolosov, Oleg ; Roberts, S. G. et al. / Characterization of surface damage via contact probes. In: Nanotechnology. 1996 ; Vol. 7, No. 3. pp. 288-294.

Bibtex

@article{0322c601ca3243a5890ee8da1efbe86d,
title = "Characterization of surface damage via contact probes",
abstract = "The mechanical performance of brittle structural materials, such as engineering ceramics, decreases drastically in the presence of cracks which are inevitably introduced during material preparation via machining and polishing. For functional brittle materials (glasses and semiconductors) their optical and electronic properties may also be affected by the presence of such cracks; furthermore, 'chemical damage' in the form of surface contamination may arise after polishing. We present here two contrasting methods, both utilizing the mechanical probing of a surface, to evaluate such damage.",
author = "Warren, {P. D.} and Oleg Kolosov and Roberts, {S. G.} and Briggs, {G. A. D.}",
year = "1996",
month = sep,
doi = "10.1088/0957-4484/7/3/019",
language = "English",
volume = "7",
pages = "288--294",
journal = "Nanotechnology",
issn = "0957-4484",
publisher = "IOP Publishing Ltd.",
number = "3",

}

RIS

TY - JOUR

T1 - Characterization of surface damage via contact probes

AU - Warren, P. D.

AU - Kolosov, Oleg

AU - Roberts, S. G.

AU - Briggs, G. A. D.

PY - 1996/9

Y1 - 1996/9

N2 - The mechanical performance of brittle structural materials, such as engineering ceramics, decreases drastically in the presence of cracks which are inevitably introduced during material preparation via machining and polishing. For functional brittle materials (glasses and semiconductors) their optical and electronic properties may also be affected by the presence of such cracks; furthermore, 'chemical damage' in the form of surface contamination may arise after polishing. We present here two contrasting methods, both utilizing the mechanical probing of a surface, to evaluate such damage.

AB - The mechanical performance of brittle structural materials, such as engineering ceramics, decreases drastically in the presence of cracks which are inevitably introduced during material preparation via machining and polishing. For functional brittle materials (glasses and semiconductors) their optical and electronic properties may also be affected by the presence of such cracks; furthermore, 'chemical damage' in the form of surface contamination may arise after polishing. We present here two contrasting methods, both utilizing the mechanical probing of a surface, to evaluate such damage.

U2 - 10.1088/0957-4484/7/3/019

DO - 10.1088/0957-4484/7/3/019

M3 - Journal article

VL - 7

SP - 288

EP - 294

JO - Nanotechnology

JF - Nanotechnology

SN - 0957-4484

IS - 3

ER -