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Charge-collection and single-event upset measurements at the ISIS neutron source

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Charge-collection and single-event upset measurements at the ISIS neutron source. / Platt, S.; Torok, Z.; Frost, C. D. et al.
In: IEEE Transactions on Nuclear Science, Vol. 55, No. 4, 2008, p. 2126 - 2132.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Platt, S, Torok, Z, Frost, CD & Ansell, S 2008, 'Charge-collection and single-event upset measurements at the ISIS neutron source', IEEE Transactions on Nuclear Science, vol. 55, no. 4, pp. 2126 - 2132. https://doi.org/10.1109/TNS.2008.918518

APA

Platt, S., Torok, Z., Frost, C. D., & Ansell, S. (2008). Charge-collection and single-event upset measurements at the ISIS neutron source. IEEE Transactions on Nuclear Science, 55(4), 2126 - 2132. https://doi.org/10.1109/TNS.2008.918518

Vancouver

Platt S, Torok Z, Frost CD, Ansell S. Charge-collection and single-event upset measurements at the ISIS neutron source. IEEE Transactions on Nuclear Science. 2008;55(4):2126 - 2132. doi: 10.1109/TNS.2008.918518

Author

Platt, S. ; Torok, Z. ; Frost, C. D. et al. / Charge-collection and single-event upset measurements at the ISIS neutron source. In: IEEE Transactions on Nuclear Science. 2008 ; Vol. 55, No. 4. pp. 2126 - 2132.

Bibtex

@article{39d7cef6121d4f48a4bf04ffefa3c9a2,
title = "Charge-collection and single-event upset measurements at the ISIS neutron source",
abstract = "Charge-collection measurements at the VESUVIO instrument at ISIS are described. Neutron SEU cross sections in SRAM-based FPGAs are measured. Results are compared to equivalent data from Los Alamos Neutron Science Center ICE House. The rate of single-event effects due to fast neutrons at VESUVIO is approximately 15% of that at LANSCE. In addition there is a strong thermal and epithermal component, sufficient to cause many events in devices containing small amounts of 10 B. The effects of low-energy neutrons on a commercial CCD contaminated with traces of 10 B are described. Cadmium shielding is found to be incompletely effective in separating the effects of fast and slow neutrons, and the implications for testing protocols and instrument design are discussed.",
author = "S. Platt and Z. Torok and Frost, {C. D.} and S. Ansell",
year = "2008",
doi = "10.1109/TNS.2008.918518",
language = "English",
volume = "55",
pages = "2126 -- 2132",
journal = "IEEE Transactions on Nuclear Science",
issn = "0018-9499",
publisher = "IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC",
number = "4",

}

RIS

TY - JOUR

T1 - Charge-collection and single-event upset measurements at the ISIS neutron source

AU - Platt, S.

AU - Torok, Z.

AU - Frost, C. D.

AU - Ansell, S.

PY - 2008

Y1 - 2008

N2 - Charge-collection measurements at the VESUVIO instrument at ISIS are described. Neutron SEU cross sections in SRAM-based FPGAs are measured. Results are compared to equivalent data from Los Alamos Neutron Science Center ICE House. The rate of single-event effects due to fast neutrons at VESUVIO is approximately 15% of that at LANSCE. In addition there is a strong thermal and epithermal component, sufficient to cause many events in devices containing small amounts of 10 B. The effects of low-energy neutrons on a commercial CCD contaminated with traces of 10 B are described. Cadmium shielding is found to be incompletely effective in separating the effects of fast and slow neutrons, and the implications for testing protocols and instrument design are discussed.

AB - Charge-collection measurements at the VESUVIO instrument at ISIS are described. Neutron SEU cross sections in SRAM-based FPGAs are measured. Results are compared to equivalent data from Los Alamos Neutron Science Center ICE House. The rate of single-event effects due to fast neutrons at VESUVIO is approximately 15% of that at LANSCE. In addition there is a strong thermal and epithermal component, sufficient to cause many events in devices containing small amounts of 10 B. The effects of low-energy neutrons on a commercial CCD contaminated with traces of 10 B are described. Cadmium shielding is found to be incompletely effective in separating the effects of fast and slow neutrons, and the implications for testing protocols and instrument design are discussed.

U2 - 10.1109/TNS.2008.918518

DO - 10.1109/TNS.2008.918518

M3 - Journal article

VL - 55

SP - 2126

EP - 2132

JO - IEEE Transactions on Nuclear Science

JF - IEEE Transactions on Nuclear Science

SN - 0018-9499

IS - 4

ER -