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Clock switching: a new design for current test (DcT) method for dynamic logic circuits

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Publication date1998
Host publicationIDDQ Testing, 1998. Proceedings. 1998 IEEE International Workshop on
Number of pages6
ISBN (Print)0818691913
<mark>Original language</mark>English


Using an Iddq test methodology on circuits with dynamic logic tends to be problematic, mainly due to charge leakage related problems. A new Design for current Testability (DcT) method has been developed, which overcomes these problems by switching the circuit into a static mode during test. The method referred to as clock switching is applicable to both domino logic and True Single-Phase Clock (TSPC) circuits. This paper shows that this technique can lead to higher levels of Iddq testability and a reduced test vector set for the detection of bridging faults