Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
}
TY - GEN
T1 - Designing high-performance & reliable superscalar architectures the out of order reliable superscalar (O3RS) approach
AU - Mendelson, A.
AU - Suri, Neeraj
PY - 2000/6/25
Y1 - 2000/6/25
N2 - As VLSI geometry continues to shrink and the level of integration increases, it is expected that the probability of faults, particularly transient faults, will increase in future microprocessors. So far, fault tolerance has chiefly been considered for special purpose or safety critical systems, but future technology will likely require integrating fault tolerance techniques into commercial systems. Such systems require low cost solutions that are transparent to the system operation and do not degrade overall performance. This paper introduces a new superscalar architecture, termed as 03RS that aims to incorporate such simple fault tolerance mechanisms as part of the basic architecture.
AB - As VLSI geometry continues to shrink and the level of integration increases, it is expected that the probability of faults, particularly transient faults, will increase in future microprocessors. So far, fault tolerance has chiefly been considered for special purpose or safety critical systems, but future technology will likely require integrating fault tolerance techniques into commercial systems. Such systems require low cost solutions that are transparent to the system operation and do not degrade overall performance. This paper introduces a new superscalar architecture, termed as 03RS that aims to incorporate such simple fault tolerance mechanisms as part of the basic architecture.
KW - Pipelines
KW - Superscalar architectures
KW - Transient errors/recovery
KW - Out of Order Reliable Superscalar approach
KW - Transient faults
KW - Computer system recovery
KW - Design
KW - Error correction
KW - Fault tolerant computer systems
KW - Pipeline processing systems
KW - Systems analysis
KW - Technological forecasting
KW - Computer architecture
U2 - 10.1109/ICDSN.2000.857578
DO - 10.1109/ICDSN.2000.857578
M3 - Conference contribution/Paper
SN - 0769507077
SP - 473
EP - 481
BT - Proceeding International Conference on Dependable Systems and Networks
PB - IEEE
T2 - International Conference on Dependable Systems and Networks.
Y2 - 25 June 2000 through 28 June 2000
ER -