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Dewetting of Au nanoparticle assemblies

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Dewetting of Au nanoparticle assemblies. / Alhummiany, Haya; Jarvis, Samuel; Woolley, Richard A. J. et al.
In: Journal of Materials Chemistry, Vol. 21, No. 42, 28.09.2011, p. 16983-16989.

Research output: Contribution to Journal/MagazineJournal articlepeer-review

Harvard

Alhummiany, H, Jarvis, S, Woolley, RAJ, Stannard, A, Blunt, M & Moriarty, P 2011, 'Dewetting of Au nanoparticle assemblies', Journal of Materials Chemistry, vol. 21, no. 42, pp. 16983-16989. https://doi.org/10.1039/c1jm12182k

APA

Alhummiany, H., Jarvis, S., Woolley, R. A. J., Stannard, A., Blunt, M., & Moriarty, P. (2011). Dewetting of Au nanoparticle assemblies. Journal of Materials Chemistry, 21(42), 16983-16989. https://doi.org/10.1039/c1jm12182k

Vancouver

Alhummiany H, Jarvis S, Woolley RAJ, Stannard A, Blunt M, Moriarty P. Dewetting of Au nanoparticle assemblies. Journal of Materials Chemistry. 2011 Sept 28;21(42):16983-16989. doi: 10.1039/c1jm12182k

Author

Alhummiany, Haya ; Jarvis, Samuel ; Woolley, Richard A. J. et al. / Dewetting of Au nanoparticle assemblies. In: Journal of Materials Chemistry. 2011 ; Vol. 21, No. 42. pp. 16983-16989.

Bibtex

@article{e5fb8f8f4823483b9fab538b0f953c56,
title = "Dewetting of Au nanoparticle assemblies",
abstract = "Atomic force microscopy measurements as a function of annealing temperature, time of exposure to a high relative humidity environment, and scan duration/parameters have been used to ascertain the stability of assemblies of thiol-passivated Au nanoparticles on silicon substrates. Striking changes in the morphology of self-organised nanoparticle patterns are observed following the exposure of samples to atmospheres with a relative humidity of 80%. The nanoparticle film dewets the underlying silicon substrate on exposure to water, forming locally thicker regions. Time-lapse imaging shows that the dewetting proceeds via layer-by-layer growth, and there is no evidence for classical coarsening mechanisms involving self-similar film morphologies. Annealing at temperatures between 100 degrees C and 160 degrees C produces a rather different dewetting effect for the highest temperatures and/or annealing times, where significant nanoparticle sintering promotes the break-up of the two-dimensional assembly. The morphology of the initial 2D film plays a key role in determining the time scale on which annealing promotes nanoparticle dewetting. Dewetting can also be induced by a scanning probe such that localised (micron-scale) areas of the nanoparticle assembly can be converted from 2D to 3D character.",
keywords = "dots,films,gold,nanocrystal superlattices,networks,rings,transport",
author = "Haya Alhummiany and Samuel Jarvis and Woolley, {Richard A. J.} and Andrew Stannard and Matthew Blunt and Philip Moriarty",
year = "2011",
month = sep,
day = "28",
doi = "10.1039/c1jm12182k",
language = "English",
volume = "21",
pages = "16983--16989",
journal = "Journal of Materials Chemistry",
issn = "0959-9428",
publisher = "Royal Society of Chemistry",
number = "42",

}

RIS

TY - JOUR

T1 - Dewetting of Au nanoparticle assemblies

AU - Alhummiany, Haya

AU - Jarvis, Samuel

AU - Woolley, Richard A. J.

AU - Stannard, Andrew

AU - Blunt, Matthew

AU - Moriarty, Philip

PY - 2011/9/28

Y1 - 2011/9/28

N2 - Atomic force microscopy measurements as a function of annealing temperature, time of exposure to a high relative humidity environment, and scan duration/parameters have been used to ascertain the stability of assemblies of thiol-passivated Au nanoparticles on silicon substrates. Striking changes in the morphology of self-organised nanoparticle patterns are observed following the exposure of samples to atmospheres with a relative humidity of 80%. The nanoparticle film dewets the underlying silicon substrate on exposure to water, forming locally thicker regions. Time-lapse imaging shows that the dewetting proceeds via layer-by-layer growth, and there is no evidence for classical coarsening mechanisms involving self-similar film morphologies. Annealing at temperatures between 100 degrees C and 160 degrees C produces a rather different dewetting effect for the highest temperatures and/or annealing times, where significant nanoparticle sintering promotes the break-up of the two-dimensional assembly. The morphology of the initial 2D film plays a key role in determining the time scale on which annealing promotes nanoparticle dewetting. Dewetting can also be induced by a scanning probe such that localised (micron-scale) areas of the nanoparticle assembly can be converted from 2D to 3D character.

AB - Atomic force microscopy measurements as a function of annealing temperature, time of exposure to a high relative humidity environment, and scan duration/parameters have been used to ascertain the stability of assemblies of thiol-passivated Au nanoparticles on silicon substrates. Striking changes in the morphology of self-organised nanoparticle patterns are observed following the exposure of samples to atmospheres with a relative humidity of 80%. The nanoparticle film dewets the underlying silicon substrate on exposure to water, forming locally thicker regions. Time-lapse imaging shows that the dewetting proceeds via layer-by-layer growth, and there is no evidence for classical coarsening mechanisms involving self-similar film morphologies. Annealing at temperatures between 100 degrees C and 160 degrees C produces a rather different dewetting effect for the highest temperatures and/or annealing times, where significant nanoparticle sintering promotes the break-up of the two-dimensional assembly. The morphology of the initial 2D film plays a key role in determining the time scale on which annealing promotes nanoparticle dewetting. Dewetting can also be induced by a scanning probe such that localised (micron-scale) areas of the nanoparticle assembly can be converted from 2D to 3D character.

KW - dots,films,gold,nanocrystal superlattices,networks,rings,transport

U2 - 10.1039/c1jm12182k

DO - 10.1039/c1jm12182k

M3 - Journal article

VL - 21

SP - 16983

EP - 16989

JO - Journal of Materials Chemistry

JF - Journal of Materials Chemistry

SN - 0959-9428

IS - 42

ER -