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Direct mapping of local Seebeck coefficient in 2D material nanostructures via scanning thermal gate microscopy

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Direct mapping of local Seebeck coefficient in 2D material nanostructures via scanning thermal gate microscopy. / Harzheim, Achim; Evangeli, Charalambos; Kolosov, Oleg et al.

In: 2D Materials, Vol. 7, No. 4, 041004, 01.10.2020.

Research output: Contribution to Journal/MagazineJournal articlepeer-review

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Harzheim A, Evangeli C, Kolosov O, Gehring P. Direct mapping of local Seebeck coefficient in 2D material nanostructures via scanning thermal gate microscopy. 2D Materials. 2020 Oct 1;7(4):041004. Epub 2020 Aug 17. doi: 10.1088/2053-1583/aba333/meta

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Bibtex

@article{6a6225aebbf946068f788c438e8c1554,
title = "Direct mapping of local Seebeck coefficient in 2D material nanostructures via scanning thermal gate microscopy",
abstract = "Studying local variations in the Seebeck coefficient of materials is important for understanding and optimizing their thermoelectric properties, yet most thermoelectric measurements are global over a whole device or material, thus overlooking spatial divergences in the signal and the role of local variation and internal structure. Such variations can be caused by local defects, metallic contacts or interfaces that often substantially influence thermoelectric properties, especially in two dimensional materials. Here, we demonstrate scanning thermal gate microscopy, a non-destructive method to obtain high resolution 2-dimensional maps of the thermovoltage, to study graphene samples. We demonstrate the efficiency of this newly developed method by measuring local Seebeck coefficient in a graphene ribbon and in a junction between single-layer and bilayer graphene.",
keywords = "2D materials, graphene, nanothermal, SThM, STGM, scanning thermal gate microscopy, scanning thermal microscopy, thermoelectric, nanoscale heat transport, heat transport, thermoelectricity, Seebeck coefficient",
author = "Achim Harzheim and Charalambos Evangeli and Oleg Kolosov and Pascal Gehring",
year = "2020",
month = oct,
day = "1",
doi = "10.1088/2053-1583/aba333/meta",
language = "English",
volume = "7",
journal = "2D Materials",
issn = "2053-1583",
publisher = "IOP Publishing Ltd.",
number = "4",

}

RIS

TY - JOUR

T1 - Direct mapping of local Seebeck coefficient in 2D material nanostructures via scanning thermal gate microscopy

AU - Harzheim, Achim

AU - Evangeli, Charalambos

AU - Kolosov, Oleg

AU - Gehring, Pascal

PY - 2020/10/1

Y1 - 2020/10/1

N2 - Studying local variations in the Seebeck coefficient of materials is important for understanding and optimizing their thermoelectric properties, yet most thermoelectric measurements are global over a whole device or material, thus overlooking spatial divergences in the signal and the role of local variation and internal structure. Such variations can be caused by local defects, metallic contacts or interfaces that often substantially influence thermoelectric properties, especially in two dimensional materials. Here, we demonstrate scanning thermal gate microscopy, a non-destructive method to obtain high resolution 2-dimensional maps of the thermovoltage, to study graphene samples. We demonstrate the efficiency of this newly developed method by measuring local Seebeck coefficient in a graphene ribbon and in a junction between single-layer and bilayer graphene.

AB - Studying local variations in the Seebeck coefficient of materials is important for understanding and optimizing their thermoelectric properties, yet most thermoelectric measurements are global over a whole device or material, thus overlooking spatial divergences in the signal and the role of local variation and internal structure. Such variations can be caused by local defects, metallic contacts or interfaces that often substantially influence thermoelectric properties, especially in two dimensional materials. Here, we demonstrate scanning thermal gate microscopy, a non-destructive method to obtain high resolution 2-dimensional maps of the thermovoltage, to study graphene samples. We demonstrate the efficiency of this newly developed method by measuring local Seebeck coefficient in a graphene ribbon and in a junction between single-layer and bilayer graphene.

KW - 2D materials

KW - graphene

KW - nanothermal

KW - SThM

KW - STGM

KW - scanning thermal gate microscopy

KW - scanning thermal microscopy

KW - thermoelectric

KW - nanoscale heat transport

KW - heat transport

KW - thermoelectricity

KW - Seebeck coefficient

U2 - 10.1088/2053-1583/aba333/meta

DO - 10.1088/2053-1583/aba333/meta

M3 - Journal article

VL - 7

JO - 2D Materials

JF - 2D Materials

SN - 2053-1583

IS - 4

M1 - 041004

ER -