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Electron-hole puddles in the absence of charged impurities

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Electron-hole puddles in the absence of charged impurities. / Gibertini, Marco; Tomadin, Andrea; Guinea, Francisco et al.
In: Physical review B, Vol. 85, No. 20, 201405, 15.05.2012.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Gibertini, M, Tomadin, A, Guinea, F, Katsnelson, MI & Polini, M 2012, 'Electron-hole puddles in the absence of charged impurities', Physical review B, vol. 85, no. 20, 201405. https://doi.org/10.1103/PhysRevB.85.201405

APA

Gibertini, M., Tomadin, A., Guinea, F., Katsnelson, M. I., & Polini, M. (2012). Electron-hole puddles in the absence of charged impurities. Physical review B, 85(20), Article 201405. https://doi.org/10.1103/PhysRevB.85.201405

Vancouver

Gibertini M, Tomadin A, Guinea F, Katsnelson MI, Polini M. Electron-hole puddles in the absence of charged impurities. Physical review B. 2012 May 15;85(20):201405. doi: 10.1103/PhysRevB.85.201405

Author

Gibertini, Marco ; Tomadin, Andrea ; Guinea, Francisco et al. / Electron-hole puddles in the absence of charged impurities. In: Physical review B. 2012 ; Vol. 85, No. 20.

Bibtex

@article{0c1efa6b156944488143284f8a4ae37f,
title = "Electron-hole puddles in the absence of charged impurities",
abstract = "It is widely believed that carrier-density inhomogeneities (“electron-hole puddles”) in single-layer graphene on a substrate such as quartz are due to charged impurities located close to the graphene sheet. Here we demonstrate by using a Kohn-Sham-Dirac density-functional scheme that corrugations in a real sample are sufficient to determine electron-hole puddles on length scales that are larger than the spatial resolution of state-of-the-art scanning tunneling microscopy.",
author = "Marco Gibertini and Andrea Tomadin and Francisco Guinea and Katsnelson, {M. I.} and Marco Polini",
year = "2012",
month = may,
day = "15",
doi = "10.1103/PhysRevB.85.201405",
language = "English",
volume = "85",
journal = "Physical review B",
issn = "1098-0121",
publisher = "AMER PHYSICAL SOC",
number = "20",

}

RIS

TY - JOUR

T1 - Electron-hole puddles in the absence of charged impurities

AU - Gibertini, Marco

AU - Tomadin, Andrea

AU - Guinea, Francisco

AU - Katsnelson, M. I.

AU - Polini, Marco

PY - 2012/5/15

Y1 - 2012/5/15

N2 - It is widely believed that carrier-density inhomogeneities (“electron-hole puddles”) in single-layer graphene on a substrate such as quartz are due to charged impurities located close to the graphene sheet. Here we demonstrate by using a Kohn-Sham-Dirac density-functional scheme that corrugations in a real sample are sufficient to determine electron-hole puddles on length scales that are larger than the spatial resolution of state-of-the-art scanning tunneling microscopy.

AB - It is widely believed that carrier-density inhomogeneities (“electron-hole puddles”) in single-layer graphene on a substrate such as quartz are due to charged impurities located close to the graphene sheet. Here we demonstrate by using a Kohn-Sham-Dirac density-functional scheme that corrugations in a real sample are sufficient to determine electron-hole puddles on length scales that are larger than the spatial resolution of state-of-the-art scanning tunneling microscopy.

U2 - 10.1103/PhysRevB.85.201405

DO - 10.1103/PhysRevB.85.201405

M3 - Journal article

VL - 85

JO - Physical review B

JF - Physical review B

SN - 1098-0121

IS - 20

M1 - 201405

ER -