Controlling the radiative properties of monolayer transition metal dichalcogenides is key to the development of atomically thin optoelectronic devices applicable to a wide range of industries. A common problem for exfoliated materials is the inherent disorder causing spatially varying nonradiative losses and therefore inhomogeneity. Here we demonstrate a five-fold reduction in the spatial inhomogeneity in monolayer WS2, resulting in enhanced overall photoluminescence emission and quality of WS2 flakes, by using an ambient-compatible laser illumination process. We propose a method to quantify spatial uniformity using statistics of spectral photoluminescence mapping. Analysis of the dynamic spectral changes shows that the enhancement is due to a spatially sensitive reduction of the charged exciton spectral weighting. The methods presented here are based on widely adopted instrumentation. They can be easily automated, making them ideal candidates for quality assessment of transition metal dichalcogenide materials, both in the laboratory and industrial environments.