Final published version, 187 KB, PDF document
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Research output: Patent
Research output: Patent
}
TY - PAT
T1 - Equipment and apparatus for measuring physical properties of material with high throughput
AU - Hajduk, Damian
AU - Carlson, Eric
AU - Freitag, Christopher
AU - Kolosov, Oleg
PY - 2004/7/14
Y1 - 2004/7/14
N2 - Multipurpose apparatus for screening a combination library with high throughput. SOLlITION: The apparatus comprising sample holder for holding the components of 8 library, probe array for perturbing an independent library component mechanically, and a sensor array for measuring response to mechanical perturbation of each library component. During scraening operation, the apparatus replaces the sample array (sample holder) and the probe array and perturbs an Independent library-componentmechanically. A material sample tested based on a large number of different bulk physical properties including Young's modulus (bending, uniaxial drawing, biaxial drawing, tearing), hardened indentation), fracture (toughness) adhesion, flowviscosity, melt flow Index, rheology).
AB - Multipurpose apparatus for screening a combination library with high throughput. SOLlITION: The apparatus comprising sample holder for holding the components of 8 library, probe array for perturbing an independent library component mechanically, and a sensor array for measuring response to mechanical perturbation of each library component. During scraening operation, the apparatus replaces the sample array (sample holder) and the probe array and perturbs an Independent library-componentmechanically. A material sample tested based on a large number of different bulk physical properties including Young's modulus (bending, uniaxial drawing, biaxial drawing, tearing), hardened indentation), fracture (toughness) adhesion, flowviscosity, melt flow Index, rheology).
KW - high throughput screening
KW - combinatorial materials discovery
KW - polymers
KW - films
KW - mechanical property
KW - parallel measurements
M3 - Patent
M1 - JP3543088(B2)
ER -