Research output: Contribution to Journal/Magazine › Journal article › peer-review
| <mark>Journal publication date</mark> | 01/1998 |
|---|---|
| <mark>Journal</mark> | International Journal of RF and Microwave Computer-Aided Engineering |
| Issue number | 1 |
| Volume | 8 |
| Number of pages | 9 |
| Pages (from-to) | 68-76 |
| Publication Status | Published |
| <mark>Original language</mark> | English |
A study on the effects of the geometrical and physical parameters of the GaAs MMIC process on the yield of large-signal circuits is presented, Large-signal yield analysis as well as large-signal yield optimization are performed using a large-signal lumped-element MIESFET model related to MMIC process parameters, and suitable for implementation in commercial microwave CAD tools, The characterization of all the statistical variables of a large-signal circuit provides a better understanding of the yield behavior, In particular, the sensitivity of large-signal yield to MMIC process parameters is computed and the statistical behaviour of each parameter is presented by means of yield sensitivity histograms. (C) 1998 John Wiley & Sons, Inc.