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Fast prediction and optimization of yield in gallium arsenide large-signal MMICs

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Fast prediction and optimization of yield in gallium arsenide large-signal MMICs. / D'Agostino, S ; Paoloni, C .

In: International Journal of RF and Microwave Computer-Aided Engineering, Vol. 8, No. 1, 01.1998, p. 68-76.

Research output: Contribution to journalJournal articlepeer-review

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D'Agostino, S & Paoloni, C 1998, 'Fast prediction and optimization of yield in gallium arsenide large-signal MMICs', International Journal of RF and Microwave Computer-Aided Engineering, vol. 8, no. 1, pp. 68-76. https://doi.org/10.1002/(SICI)1099-047X(199801)8:1<68::AID-MMCE10>3.0.CO;2-K

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D'Agostino, S ; Paoloni, C . / Fast prediction and optimization of yield in gallium arsenide large-signal MMICs. In: International Journal of RF and Microwave Computer-Aided Engineering. 1998 ; Vol. 8, No. 1. pp. 68-76.

Bibtex

@article{fa117037c0cd46e4ac6a854a6e77653e,
title = "Fast prediction and optimization of yield in gallium arsenide large-signal MMICs",
abstract = "A study on the effects of the geometrical and physical parameters of the GaAs MMIC process on the yield of large-signal circuits is presented, Large-signal yield analysis as well as large-signal yield optimization are performed using a large-signal lumped-element MIESFET model related to MMIC process parameters, and suitable for implementation in commercial microwave CAD tools, The characterization of all the statistical variables of a large-signal circuit provides a better understanding of the yield behavior, In particular, the sensitivity of large-signal yield to MMIC process parameters is computed and the statistical behaviour of each parameter is presented by means of yield sensitivity histograms. (C) 1998 John Wiley & Sons, Inc.",
keywords = "yield, optimization , nonlinear circuits, MMIC",
author = "S D'Agostino and C Paoloni",
year = "1998",
month = jan,
doi = "10.1002/(SICI)1099-047X(199801)8:1<68::AID-MMCE10>3.0.CO;2-K",
language = "English",
volume = "8",
pages = "68--76",
journal = "International Journal of RF and Microwave Computer-Aided Engineering",
issn = "1096-4290",
publisher = "John Wiley and Sons Inc.",
number = "1",

}

RIS

TY - JOUR

T1 - Fast prediction and optimization of yield in gallium arsenide large-signal MMICs

AU - D'Agostino, S

AU - Paoloni, C

PY - 1998/1

Y1 - 1998/1

N2 - A study on the effects of the geometrical and physical parameters of the GaAs MMIC process on the yield of large-signal circuits is presented, Large-signal yield analysis as well as large-signal yield optimization are performed using a large-signal lumped-element MIESFET model related to MMIC process parameters, and suitable for implementation in commercial microwave CAD tools, The characterization of all the statistical variables of a large-signal circuit provides a better understanding of the yield behavior, In particular, the sensitivity of large-signal yield to MMIC process parameters is computed and the statistical behaviour of each parameter is presented by means of yield sensitivity histograms. (C) 1998 John Wiley & Sons, Inc.

AB - A study on the effects of the geometrical and physical parameters of the GaAs MMIC process on the yield of large-signal circuits is presented, Large-signal yield analysis as well as large-signal yield optimization are performed using a large-signal lumped-element MIESFET model related to MMIC process parameters, and suitable for implementation in commercial microwave CAD tools, The characterization of all the statistical variables of a large-signal circuit provides a better understanding of the yield behavior, In particular, the sensitivity of large-signal yield to MMIC process parameters is computed and the statistical behaviour of each parameter is presented by means of yield sensitivity histograms. (C) 1998 John Wiley & Sons, Inc.

KW - yield

KW - optimization

KW - nonlinear circuits

KW - MMIC

U2 - 10.1002/(SICI)1099-047X(199801)8:1<68::AID-MMCE10>3.0.CO;2-K

DO - 10.1002/(SICI)1099-047X(199801)8:1<68::AID-MMCE10>3.0.CO;2-K

M3 - Journal article

VL - 8

SP - 68

EP - 76

JO - International Journal of RF and Microwave Computer-Aided Engineering

JF - International Journal of RF and Microwave Computer-Aided Engineering

SN - 1096-4290

IS - 1

ER -