Standard
Harvard
Hajduk, D, Carlson, E, Freitag, C
, Kolosov, O, Engstrom, J, Safir, A, Shrinivasan, R & Matsiev, L Mar. 06 2003,
High throughput mechanical property and bulge testing of materials libraries, Patent No. US 2003/0041672 A1. <
http://www.patents.com/us-20030041672.html>
APA
Hajduk, D., Carlson, E., Freitag, C.
, Kolosov, O., Engstrom, J., Safir, A., Shrinivasan, R., & Matsiev, L. (2003).
High throughput mechanical property and bulge testing of materials libraries. (Patent No.
US 2003/0041672 A1).
http://www.patents.com/us-20030041672.html
Vancouver
Author
Bibtex
@misc{08f1845799254780b82a6087cf0b08c7,
title = "High throughput mechanical property and bulge testing of materials libraries",
abstract = "A method for high throughput mechanical property and bulge testing of materials libraries. A plurality of samples on a substrate are monitored for their response to a force from a fluid.",
keywords = "high throughput screening, combinatorial materials discovery, polymers, films, mechanical property, parallel measurements",
author = "Damian Hajduk and Eric Carlson and Christopher Freitag and Oleg Kolosov and James Engstrom and Adam Safir and Ravi Shrinivasan and L Matsiev",
year = "2003",
month = mar,
day = "6",
language = "English",
type = "Patent",
note = "US 2003/0041672 A1; GOIL 1/24",
}
RIS
TY - PAT
T1 - High throughput mechanical property and bulge testing of materials libraries
AU - Hajduk, Damian
AU - Carlson, Eric
AU - Freitag, Christopher
AU - Kolosov, Oleg
AU - Engstrom, James
AU - Safir, Adam
AU - Shrinivasan, Ravi
AU - Matsiev, L
PY - 2003/3/6
Y1 - 2003/3/6
N2 - A method for high throughput mechanical property and bulge testing of materials libraries. A plurality of samples on a substrate are monitored for their response to a force from a fluid.
AB - A method for high throughput mechanical property and bulge testing of materials libraries. A plurality of samples on a substrate are monitored for their response to a force from a fluid.
KW - high throughput screening
KW - combinatorial materials discovery
KW - polymers
KW - films
KW - mechanical property
KW - parallel measurements
M3 - Patent
M1 - US 2003/0041672 A1
ER -