Final published version, 1.81 MB, PDF document
Available under license: CC BY-NC-ND
Research output: Patent
Research output: Patent
}
TY - PAT
T1 - High throughput mechanical property testing of materials libraries using a piezoelectric
AU - Hajduk, Damian A.
AU - Carlson, Eric D.
AU - Freitag, Christopher
AU - Kolosov, Oleg
AU - Engstrom, James
AU - Safir, Adam
AU - Shrinivasan, Ravi
AU - Matsiev, L
PY - 2003/11/18
Y1 - 2003/11/18
N2 - The present invention provides instruments and methods for screening combinatorial libraries that addresses many of the problems encountered when using conventional instruments. For example, the disclosed instruments can measure mechanical properties of library members in rapid serial or parallel test format, and can perform tests on small amounts of material, which are easily prepared or dispensed using art-disclosed liquid or solid handling techniques. Compared to conventional instruments, the disclosed instruments afford fa"Ster sample loading and unloading, for example, through the use of disposable libraries of material samples.
AB - The present invention provides instruments and methods for screening combinatorial libraries that addresses many of the problems encountered when using conventional instruments. For example, the disclosed instruments can measure mechanical properties of library members in rapid serial or parallel test format, and can perform tests on small amounts of material, which are easily prepared or dispensed using art-disclosed liquid or solid handling techniques. Compared to conventional instruments, the disclosed instruments afford fa"Ster sample loading and unloading, for example, through the use of disposable libraries of material samples.
KW - high throughput screening
KW - combinatorial materials discovery
KW - polymers
KW - films
KW - mechanical property
KW - parallel measurements
M3 - Patent
M1 - US 6,650,102 B2
ER -