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High throughput mechanical property testing of materials libraries using a piezoelectric

Research output: Patent

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High throughput mechanical property testing of materials libraries using a piezoelectric. / Hajduk, Damian A. (Inventor); Carlson, Eric D. (Inventor); Freitag, Christopher (Inventor) et al.
Patent No.: US 6,650,102 B2. Nov 18, 2003.

Research output: Patent

Harvard

Hajduk, DA, Carlson, ED, Freitag, C, Kolosov, O, Engstrom, J, Safir, A, Shrinivasan, R & Matsiev, L Nov. 18 2003, High throughput mechanical property testing of materials libraries using a piezoelectric, Patent No. US 6,650,102 B2. <http://www.patents.com/us-6650102.html>

APA

Hajduk, D. A., Carlson, E. D., Freitag, C., Kolosov, O., Engstrom, J., Safir, A., Shrinivasan, R., & Matsiev, L. (2003). High throughput mechanical property testing of materials libraries using a piezoelectric. (Patent No. US 6,650,102 B2). http://www.patents.com/us-6650102.html

Vancouver

Hajduk DA, Carlson ED, Freitag C, Kolosov O, Engstrom J, Safir A et al., inventors. High throughput mechanical property testing of materials libraries using a piezoelectric. US 6,650,102 B2. 2003 Nov 18.

Author

Hajduk, Damian A. (Inventor) ; Carlson, Eric D. (Inventor) ; Freitag, Christopher (Inventor) et al. / High throughput mechanical property testing of materials libraries using a piezoelectric. Patent No.: US 6,650,102 B2. Nov 18, 2003.

Bibtex

@misc{c4b7419ac2944cd09835e02d0396fd53,
title = "High throughput mechanical property testing of materials libraries using a piezoelectric",
abstract = "The present invention provides instruments and methods for screening combinatorial libraries that addresses many of the problems encountered when using conventional instruments. For example, the disclosed instruments can measure mechanical properties of library members in rapid serial or parallel test format, and can perform tests on small amounts of material, which are easily prepared or dispensed using art-disclosed liquid or solid handling techniques. Compared to conventional instruments, the disclosed instruments afford fa{"}Ster sample loading and unloading, for example, through the use of disposable libraries of material samples.",
keywords = "high throughput screening, combinatorial materials discovery, polymers, films, mechanical property, parallel measurements",
author = "Hajduk, {Damian A.} and Carlson, {Eric D.} and Christopher Freitag and Oleg Kolosov and James Engstrom and Adam Safir and Ravi Shrinivasan and L Matsiev",
year = "2003",
month = nov,
day = "18",
language = "English",
type = "Patent",
note = "US 6,650,102 B2; GOIN 3/10,3/36",

}

RIS

TY - PAT

T1 - High throughput mechanical property testing of materials libraries using a piezoelectric

AU - Hajduk, Damian A.

AU - Carlson, Eric D.

AU - Freitag, Christopher

AU - Kolosov, Oleg

AU - Engstrom, James

AU - Safir, Adam

AU - Shrinivasan, Ravi

AU - Matsiev, L

PY - 2003/11/18

Y1 - 2003/11/18

N2 - The present invention provides instruments and methods for screening combinatorial libraries that addresses many of the problems encountered when using conventional instruments. For example, the disclosed instruments can measure mechanical properties of library members in rapid serial or parallel test format, and can perform tests on small amounts of material, which are easily prepared or dispensed using art-disclosed liquid or solid handling techniques. Compared to conventional instruments, the disclosed instruments afford fa"Ster sample loading and unloading, for example, through the use of disposable libraries of material samples.

AB - The present invention provides instruments and methods for screening combinatorial libraries that addresses many of the problems encountered when using conventional instruments. For example, the disclosed instruments can measure mechanical properties of library members in rapid serial or parallel test format, and can perform tests on small amounts of material, which are easily prepared or dispensed using art-disclosed liquid or solid handling techniques. Compared to conventional instruments, the disclosed instruments afford fa"Ster sample loading and unloading, for example, through the use of disposable libraries of material samples.

KW - high throughput screening

KW - combinatorial materials discovery

KW - polymers

KW - films

KW - mechanical property

KW - parallel measurements

M3 - Patent

M1 - US 6,650,102 B2

ER -