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High throughput mechanical property testing of materials libraries using capacitance

Research output: Patent

Published

Standard

High throughput mechanical property testing of materials libraries using capacitance. / Hajduk, Damian (Inventor); Carlson, Eric (Inventor); Freitag, Christopher (Inventor) et al.
Patent No.: US 2004/0155668 A1. Aug 12, 2004.

Research output: Patent

Harvard

Hajduk, D, Carlson, E, Freitag, C, Kolosov, O, Engstrom, J, Safir, A, Shrinivasan, R & Matsiev, L Aug. 12 2004, High throughput mechanical property testing of materials libraries using capacitance, Patent No. US 2004/0155668 A1. <http://www.patentlens.net/patentlens/patents.html?patnums=US_2004_0155668_A1&language=en&>

APA

Hajduk, D., Carlson, E., Freitag, C., Kolosov, O., Engstrom, J., Safir, A., Shrinivasan, R., & Matsiev, L. (2004). High throughput mechanical property testing of materials libraries using capacitance. (Patent No. US 2004/0155668 A1). http://www.patentlens.net/patentlens/patents.html?patnums=US_2004_0155668_A1&language=en&

Vancouver

Hajduk D, Carlson E, Freitag C, Kolosov O, Engstrom J, Safir A et al., inventors. High throughput mechanical property testing of materials libraries using capacitance. US 2004/0155668 A1. 2004 Aug 12.

Author

Hajduk, Damian (Inventor) ; Carlson, Eric (Inventor) ; Freitag, Christopher (Inventor) et al. / High throughput mechanical property testing of materials libraries using capacitance. Patent No.: US 2004/0155668 A1. Aug 12, 2004.

Bibtex

@misc{1e8aaaa5ec6a4397bcc407f06af4dcd0,
title = "High throughput mechanical property testing of materials libraries using capacitance",
abstract = "One aspect of the present invention provides instruments for measuring mechanical properties of a combinatorial library of materials. The instruments include at least one capacitor to which a member of a library of material samples is removably secured for testing; at least one voltage source for delivering one or more forces to each library member; and at least one sensing device for monitoring the response each library member to the one or more forces. Another aspect of the present invention provides methods of screening a combinatorial library of materials where the method monitors the responses of a plurality of samples on a substrate to a force induced by a capacitor.",
keywords = "high throughput screening, combinatorial materials discovery, polymers, films, mechanical property, parallel measurements",
author = "Damian Hajduk and Eric Carlson and Christopher Freitag and Oleg Kolosov and James Engstrom and Adam Safir and Ravi Shrinivasan and L Matsiev",
year = "2004",
month = aug,
day = "12",
language = "English",
type = "Patent",
note = "US 2004/0155668 A1; GO1R 27/26",

}

RIS

TY - PAT

T1 - High throughput mechanical property testing of materials libraries using capacitance

AU - Hajduk, Damian

AU - Carlson, Eric

AU - Freitag, Christopher

AU - Kolosov, Oleg

AU - Engstrom, James

AU - Safir, Adam

AU - Shrinivasan, Ravi

AU - Matsiev, L

PY - 2004/8/12

Y1 - 2004/8/12

N2 - One aspect of the present invention provides instruments for measuring mechanical properties of a combinatorial library of materials. The instruments include at least one capacitor to which a member of a library of material samples is removably secured for testing; at least one voltage source for delivering one or more forces to each library member; and at least one sensing device for monitoring the response each library member to the one or more forces. Another aspect of the present invention provides methods of screening a combinatorial library of materials where the method monitors the responses of a plurality of samples on a substrate to a force induced by a capacitor.

AB - One aspect of the present invention provides instruments for measuring mechanical properties of a combinatorial library of materials. The instruments include at least one capacitor to which a member of a library of material samples is removably secured for testing; at least one voltage source for delivering one or more forces to each library member; and at least one sensing device for monitoring the response each library member to the one or more forces. Another aspect of the present invention provides methods of screening a combinatorial library of materials where the method monitors the responses of a plurality of samples on a substrate to a force induced by a capacitor.

KW - high throughput screening

KW - combinatorial materials discovery

KW - polymers

KW - films

KW - mechanical property

KW - parallel measurements

M3 - Patent

M1 - US 2004/0155668 A1

ER -