Research output: Patent
Research output: Patent
}
TY - PAT
T1 - High throughput mechanical property testing of materials libraries using capacitance
AU - Hajduk, Damian
AU - Carlson, Eric
AU - Freitag, Christopher
AU - Kolosov, Oleg
AU - Engstrom, James
AU - Safir, Adam
AU - Shrinivasan, Ravi
AU - Matsiev, L
PY - 2004/8/12
Y1 - 2004/8/12
N2 - One aspect of the present invention provides instruments for measuring mechanical properties of a combinatorial library of materials. The instruments include at least one capacitor to which a member of a library of material samples is removably secured for testing; at least one voltage source for delivering one or more forces to each library member; and at least one sensing device for monitoring the response each library member to the one or more forces. Another aspect of the present invention provides methods of screening a combinatorial library of materials where the method monitors the responses of a plurality of samples on a substrate to a force induced by a capacitor.
AB - One aspect of the present invention provides instruments for measuring mechanical properties of a combinatorial library of materials. The instruments include at least one capacitor to which a member of a library of material samples is removably secured for testing; at least one voltage source for delivering one or more forces to each library member; and at least one sensing device for monitoring the response each library member to the one or more forces. Another aspect of the present invention provides methods of screening a combinatorial library of materials where the method monitors the responses of a plurality of samples on a substrate to a force induced by a capacitor.
KW - high throughput screening
KW - combinatorial materials discovery
KW - polymers
KW - films
KW - mechanical property
KW - parallel measurements
M3 - Patent
M1 - US 2004/0155668 A1
ER -