Home > Research > Publications & Outputs > Hot electron transport and impact ionization in...

Links

Text available via DOI:

View graph of relations

Hot electron transport and impact ionization in the narrow energy gap InAs1-xNx alloy.

Research output: Contribution to Journal/MagazineJournal articlepeer-review

Published

Standard

Hot electron transport and impact ionization in the narrow energy gap InAs1-xNx alloy. / Makarovsky, O.; Feu, W. H. M.; Patane, A. et al.

In: Applied Physics Letters, Vol. 96, No. 5, 01.02.2010, p. 052115.

Research output: Contribution to Journal/MagazineJournal articlepeer-review

Harvard

Makarovsky, O, Feu, WHM, Patane, A, Eaves, L, Zhuang, QD, Krier, A, Beanland, R & Airey, R 2010, 'Hot electron transport and impact ionization in the narrow energy gap InAs1-xNx alloy.', Applied Physics Letters, vol. 96, no. 5, pp. 052115. https://doi.org/10.1063/1.3306737

APA

Makarovsky, O., Feu, W. H. M., Patane, A., Eaves, L., Zhuang, Q. D., Krier, A., Beanland, R., & Airey, R. (2010). Hot electron transport and impact ionization in the narrow energy gap InAs1-xNx alloy. Applied Physics Letters, 96(5), 052115. https://doi.org/10.1063/1.3306737

Vancouver

Makarovsky O, Feu WHM, Patane A, Eaves L, Zhuang QD, Krier A et al. Hot electron transport and impact ionization in the narrow energy gap InAs1-xNx alloy. Applied Physics Letters. 2010 Feb 1;96(5):052115. doi: 10.1063/1.3306737

Author

Makarovsky, O. ; Feu, W. H. M. ; Patane, A. et al. / Hot electron transport and impact ionization in the narrow energy gap InAs1-xNx alloy. In: Applied Physics Letters. 2010 ; Vol. 96, No. 5. pp. 052115.

Bibtex

@article{5cdb4d83d65641c0846428f2010dc792,
title = "Hot electron transport and impact ionization in the narrow energy gap InAs1-xNx alloy.",
abstract = "We report an experimental study of hot electron dynamics in the narrow band gap dilute nitride alloy, InAs1-xNx, with x up to 0.6%. The sharp increase in the conductivity of n-type InAs1-xNx at applied electric fields above 1 kV/cm demonstrates that impact ionization dominates the hot electron dynamics. This observation, combined with the reduction in the band gap energy by the N-atoms, suggest prospects for the use of this narrow gap alloy in infrared avalanche photodiodes",
author = "O. Makarovsky and Feu, {W. H. M.} and A. Patane and L. Eaves and Zhuang, {Q. D.} and Anthony Krier and R. Beanland and R. Airey",
year = "2010",
month = feb,
day = "1",
doi = "10.1063/1.3306737",
language = "English",
volume = "96",
pages = "052115",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Inc.",
number = "5",

}

RIS

TY - JOUR

T1 - Hot electron transport and impact ionization in the narrow energy gap InAs1-xNx alloy.

AU - Makarovsky, O.

AU - Feu, W. H. M.

AU - Patane, A.

AU - Eaves, L.

AU - Zhuang, Q. D.

AU - Krier, Anthony

AU - Beanland, R.

AU - Airey, R.

PY - 2010/2/1

Y1 - 2010/2/1

N2 - We report an experimental study of hot electron dynamics in the narrow band gap dilute nitride alloy, InAs1-xNx, with x up to 0.6%. The sharp increase in the conductivity of n-type InAs1-xNx at applied electric fields above 1 kV/cm demonstrates that impact ionization dominates the hot electron dynamics. This observation, combined with the reduction in the band gap energy by the N-atoms, suggest prospects for the use of this narrow gap alloy in infrared avalanche photodiodes

AB - We report an experimental study of hot electron dynamics in the narrow band gap dilute nitride alloy, InAs1-xNx, with x up to 0.6%. The sharp increase in the conductivity of n-type InAs1-xNx at applied electric fields above 1 kV/cm demonstrates that impact ionization dominates the hot electron dynamics. This observation, combined with the reduction in the band gap energy by the N-atoms, suggest prospects for the use of this narrow gap alloy in infrared avalanche photodiodes

U2 - 10.1063/1.3306737

DO - 10.1063/1.3306737

M3 - Journal article

VL - 96

SP - 052115

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 5

ER -