Home > Research > Publications & Outputs > Impedance rescaling and scattering from transfo...

Associated organisational units

Links

Text available via DOI:

View graph of relations

Impedance rescaling and scattering from transformation optics devices

Research output: Contribution to Journal/MagazineJournal articlepeer-review

Published

Standard

Impedance rescaling and scattering from transformation optics devices. / Kinsler, Paul.
In: Journal of Physics Communications, Vol. 2, No. 4, 045011, 04.04.2018.

Research output: Contribution to Journal/MagazineJournal articlepeer-review

Harvard

APA

Vancouver

Kinsler P. Impedance rescaling and scattering from transformation optics devices. Journal of Physics Communications. 2018 Apr 4;2(4):045011. Epub 2018 Mar 19. doi: 10.1088/2399-6528/aab7dd

Author

Kinsler, Paul. / Impedance rescaling and scattering from transformation optics devices. In: Journal of Physics Communications. 2018 ; Vol. 2, No. 4.

Bibtex

@article{993750eb1ecb4fad9912eab0657b2a19,
title = "Impedance rescaling and scattering from transformation optics devices",
abstract = "I investigate the scattering properties of transformation devices as the impedance matching criteria are altered. Starting from an analysis of traditional impedance calculations, we see how to preserve the cloak's {"}steering{"} refractive index profile whilst adjusting the {"}scattering{"} impedance profile. Results are presented for transformation devices in a cylindrical geometry, but the lessons apply to both simpler and more complicated transformation devices. One technique used here is the use of impulsive field inputs, so that scattered fields are more easily distinguished from non-scattered fields. A two-axis continuous range of impedance profiles is shown to cover the three most important cases. This range is investigated numerically, with the summed scattering field being used as an indicator of device performance. We see that the standard {"}$\kappa$-medium{"} case where $\epsilon=\mu$ gives best performance, but with different rescalings giving different levels of deterioration. ",
author = "Paul Kinsler",
year = "2018",
month = apr,
day = "4",
doi = "10.1088/2399-6528/aab7dd",
language = "English",
volume = "2",
journal = "Journal of Physics Communications",
issn = "2399-6528",
publisher = "IOP Science",
number = "4",

}

RIS

TY - JOUR

T1 - Impedance rescaling and scattering from transformation optics devices

AU - Kinsler, Paul

PY - 2018/4/4

Y1 - 2018/4/4

N2 - I investigate the scattering properties of transformation devices as the impedance matching criteria are altered. Starting from an analysis of traditional impedance calculations, we see how to preserve the cloak's "steering" refractive index profile whilst adjusting the "scattering" impedance profile. Results are presented for transformation devices in a cylindrical geometry, but the lessons apply to both simpler and more complicated transformation devices. One technique used here is the use of impulsive field inputs, so that scattered fields are more easily distinguished from non-scattered fields. A two-axis continuous range of impedance profiles is shown to cover the three most important cases. This range is investigated numerically, with the summed scattering field being used as an indicator of device performance. We see that the standard "$\kappa$-medium" case where $\epsilon=\mu$ gives best performance, but with different rescalings giving different levels of deterioration.

AB - I investigate the scattering properties of transformation devices as the impedance matching criteria are altered. Starting from an analysis of traditional impedance calculations, we see how to preserve the cloak's "steering" refractive index profile whilst adjusting the "scattering" impedance profile. Results are presented for transformation devices in a cylindrical geometry, but the lessons apply to both simpler and more complicated transformation devices. One technique used here is the use of impulsive field inputs, so that scattered fields are more easily distinguished from non-scattered fields. A two-axis continuous range of impedance profiles is shown to cover the three most important cases. This range is investigated numerically, with the summed scattering field being used as an indicator of device performance. We see that the standard "$\kappa$-medium" case where $\epsilon=\mu$ gives best performance, but with different rescalings giving different levels of deterioration.

U2 - 10.1088/2399-6528/aab7dd

DO - 10.1088/2399-6528/aab7dd

M3 - Journal article

VL - 2

JO - Journal of Physics Communications

JF - Journal of Physics Communications

SN - 2399-6528

IS - 4

M1 - 045011

ER -