Home > Research > Publications & Outputs > Instrument for high throughput measurement of m...

Electronic data

Links

View graph of relations

Instrument for high throughput measurement of material physical properties and method of using same

Research output: Patent

Published

Standard

Instrument for high throughput measurement of material physical properties and method of using same. / Freitag, Christopher (Inventor); Kolosov, Oleg (Inventor); Hajduk, Damian (Inventor); Carlson, Eric (Inventor).

Patent No.: CA2344755A1. Apr 18, 2001.

Research output: Patent

Harvard

APA

Vancouver

Author

Freitag, Christopher (Inventor) ; Kolosov, Oleg (Inventor) ; Hajduk, Damian (Inventor) ; Carlson, Eric (Inventor). / Instrument for high throughput measurement of material physical properties and method of using same. Patent No.: CA2344755A1. Apr 18, 2001.

Bibtex

@misc{b3eb73d72b984f978bf6bbbd11dc6569,
title = "Instrument for high throughput measurement of material physical properties and method of using same",
abstract = "An apparatus and method for screening combinatorial libraries of materials by measuring the response of individual library members to mechanical perturbations is described. The apparatus generally includes a sample holder for containing the library members, an array of probes for mechanically perturbing individual library members, and an array of sensors for measuring the response of each of the library members to the mechanical perturbations. Library members undergoing screening make up a sample array, and individual library members constitute elements of the sample array that are confined to specific locations on the sample holder. During screening, the apparatus mechanically perturbs individual library members by displacing the sample array (sample holder) and the array of probes. Typically, all of the elements of the sample array are perturbed simultaneously, but the apparatus also can also perturb individual or groups of sample array elements sequentially. The flexible apparatus and method can screen libraries of materials based on many different bulk physical properties, including Young's modulus (flexure, uniaxial extension, biaxial compression, and shear); hardness (indentation), failure (stress and strain at failure, toughness), adhesion (tack, loop tack), and flow (viscosity, meltflow indexing, and rheology), among others.",
keywords = "high throughput screening, combinatorial materials discovery, polymers, films, mechanical property, parallel measurements",
author = "Christopher Freitag and Oleg Kolosov and Damian Hajduk and Eric Carlson",
year = "2001",
month = apr,
day = "18",
language = "English",
type = "Patent",
note = "CA2344755A1; GO1N 3/00;",

}

RIS

TY - PAT

T1 - Instrument for high throughput measurement of material physical properties and method of using same

AU - Freitag, Christopher

AU - Kolosov, Oleg

AU - Hajduk, Damian

AU - Carlson, Eric

PY - 2001/4/18

Y1 - 2001/4/18

N2 - An apparatus and method for screening combinatorial libraries of materials by measuring the response of individual library members to mechanical perturbations is described. The apparatus generally includes a sample holder for containing the library members, an array of probes for mechanically perturbing individual library members, and an array of sensors for measuring the response of each of the library members to the mechanical perturbations. Library members undergoing screening make up a sample array, and individual library members constitute elements of the sample array that are confined to specific locations on the sample holder. During screening, the apparatus mechanically perturbs individual library members by displacing the sample array (sample holder) and the array of probes. Typically, all of the elements of the sample array are perturbed simultaneously, but the apparatus also can also perturb individual or groups of sample array elements sequentially. The flexible apparatus and method can screen libraries of materials based on many different bulk physical properties, including Young's modulus (flexure, uniaxial extension, biaxial compression, and shear); hardness (indentation), failure (stress and strain at failure, toughness), adhesion (tack, loop tack), and flow (viscosity, meltflow indexing, and rheology), among others.

AB - An apparatus and method for screening combinatorial libraries of materials by measuring the response of individual library members to mechanical perturbations is described. The apparatus generally includes a sample holder for containing the library members, an array of probes for mechanically perturbing individual library members, and an array of sensors for measuring the response of each of the library members to the mechanical perturbations. Library members undergoing screening make up a sample array, and individual library members constitute elements of the sample array that are confined to specific locations on the sample holder. During screening, the apparatus mechanically perturbs individual library members by displacing the sample array (sample holder) and the array of probes. Typically, all of the elements of the sample array are perturbed simultaneously, but the apparatus also can also perturb individual or groups of sample array elements sequentially. The flexible apparatus and method can screen libraries of materials based on many different bulk physical properties, including Young's modulus (flexure, uniaxial extension, biaxial compression, and shear); hardness (indentation), failure (stress and strain at failure, toughness), adhesion (tack, loop tack), and flow (viscosity, meltflow indexing, and rheology), among others.

KW - high throughput screening

KW - combinatorial materials discovery

KW - polymers

KW - films

KW - mechanical property

KW - parallel measurements

M3 - Patent

M1 - CA2344755A1

ER -